Touch chip test system and test method based on matrix capacitor plate

Abstract

The invention belongs to the technical field of touch screens, and discloses a Touch control chip testing system based on matrix capacitor plate and testing method thereof. The testing system includes a matrix capacitor plate, a configuration file acquiring module, a testing link simulation module and a testing module. The testing module is built in with a testing program and is intended for loading the configuration file to a testing program. The testing program which is loaded with the configuration file is operated on the simulated self-capacitance link or the simulated mutual capacitance. According to the invention, if a to-be-tested touch control chip is a mutual capacitance touch control chip, the matrix capacitor plate and the to-be-tested touch control chip can simulate the mutual capacitance link together, and if the to-be-tested touch control chip is a self-capacitance touch control chip, the matrix capacitor plate and the to-be-tested touch control chip can simulate a self-capacitance link together. The system realizes the tests of mutual capacitance touch control chips and the self-capacitance touch control chips on the basis of the matrix capacitor plate, and increase the test coverage rate of the matrix capacitor plate.

Description

technical field [0001] The invention belongs to the technical field of touch screens, and in particular relates to a touch chip testing system and a testing method based on a matrix capacitor plate. Background technique [0002] Various touch screen terminals such as smartphones need to use touch chips to identify and respond to user touch operations, and the normal operation of touch chips is a prerequisite for the normal use of touch screen terminals. [0003] The popularity of touch screen terminals has brought about explosive growth in touch chip shipments, and in the process of mass production of touch chips, strict testing and analysis of touch chips is required to ensure that the shipments of touch chips able to work. The current touch chip testing and analysis methods have the following problems: [0004] 1. The coverage of test tools is limited. Commonly used touch screens include mutual capacitance and self-capacitance. Usually, the test tool for mutual-capacita...

AI Technical Summary

Problems solved by technology

Commonly used touch screens include mutual capacitance and self-capacitance. Usually, the test tool for mutual-capacitance touch chips is a matrix capacitor board, but the matrix capacitor board can only be used to test mutual-capacitance touch chips and not for self-capacitance. Touch chip, resulting in insufficient test coverage of the matrix capacitive board

[0005] 2. The test error of the self-capacitive touch chip is relatively large

When testing the self-capacitive touch chip, the ground capacitance of different fixed values ​​is used to simulate the change of self-capacitance between different channels of the touch chip, but the deviation between channels is added to the fixed value, so the test error is relatively large. Big

[0006] 3. The comprehensiveness and accuracy of testing self-capacitive touch chips are poor

When testing self-capacitance touch chips, it is not comprehensive and accurate to test whether the signal quantity changes under different self-capacitance gears meet expectations to evaluate the circuit performance when self-capacitance changes, because first, the test gear is limited; second , the change of the test semaphore is mixed with the numerical offset caused by the manufacturing difference of the chip and the deviation of the test tool

Images