A test method and device for compatibility and adaptation between a disk array and a host

Abstract

The invention discloses a test method for compatibility and adaptation between a disk array and a host. The LUN divided by the device under test is mapped to the host end through multiple paths. After the host adds and recognizes the LUN of the device under test, it creates a file system, and perform basic reading and writing tests on the file system. After a series of basic tests on the device under test, the purpose of testing the stability of the host is achieved by continuously reading and writing the device under test. The present invention Through a series of comprehensive tests, it is ensured that the host computer and the corresponding disk array can have relatively good compatibility and adaptation, and the test method of the present invention can be used for various types of disk arrays, and has universality. The present invention also discloses a The test device which is compatible and adapted to the disk array and the host computer has the above beneficial effects.

Description

technical field [0001] The invention relates to the field of host equipment, in particular to a test method and device for compatibility and adaptation between a disk array and a host. Background technique [0002] Inspur Tiansuo K1 system is the result of the major special project of my country's 863 program "development and application of high-end fault-tolerant computers". Inspur Tiansuo K1 system, my country's first key application mainframe, marks that my country has become the third country in the world to master new-generation mainframe technology after the United States and Japan, and is expected to change my country's embarrassment of long-term dependence on imports of large mainframes in core fields such as finance and telecommunications The situation follows. [0003] Since the host needs to be equipped with a disk array as a storage device to complete various functions, and the compatibility and adaptation between the host and disk arrays of different brands and ...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a test method for compatibility and adaptation between a disk array and a host, which solves the problem that the disk array test for brands and models is not comprehensive and does not have universality. Carry out a comprehensive evaluation to ensure the stability and performance of later on-line applications. The invention also provides a test device compatible with the disk array and the host

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