Method and device for testing compatibility between RIADs (redundant array of inexpensive disks) and host

Abstract

The invention discloses a method for testing compatibility between RIADs (redundant array of inexpensive disks) and a host. The method includes mapping LUN divided from equipment under test to the host side by multiple paths; through the host, adding and identifying the LUN of the equipment under test and then creating file systems on the LUN and performing basic read and write tests on the file systems; after finishing a series of basic tests on the equipment under test, continuing to perform read and write operation on the equipment under test, thereby achieving the purpose of testing the stability of the host. Through a series of all-round tests, the good compatibility between the host and the corresponding RIAD is guaranteed. The method is applicable to the RIADs in various types, and is a universal method. The invention further discloses a device for testing compatibility between RIADs and the host, which has the same advantages as the method.

Description

technical field [0001] The invention relates to the field of host equipment, in particular to a test method and device for compatibility and adaptation between a disk array and a host. Background technique [0002] Inspur Tiansuo K1 system is the result of the major special project of my country's 863 program "development and application of high-end fault-tolerant computers". Inspur Tiansuo K1 system, my country's first key application mainframe, marks that my country has become the third country in the world to master new-generation mainframe technology after the United States and Japan, and is expected to change my country's embarrassment of long-term dependence on imports of large mainframes in core fields such as finance and telecommunications The situation follows. [0003] Since the host needs to be equipped with a disk array as a storage device to complete various functions, and the compatibility and adaptation between the host and disk arrays of different brands and ...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a test method for compatibility and adaptation between a disk array and a host, which solves the problem that the disk array test for brands and models is not comprehensive and does not have universality. Carry out a comprehensive evaluation to ensure the stability and performance of later on-line applications. The invention also provides a test device compatible with the disk array and the host

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