Electronic element testing device with novel discharging mechanism
A technology of discharging mechanism and electronic components, which is applied in sorting and other directions, and can solve problems such as high cost and complex structure of screening mechanism
Pending Publication Date: 2018-01-19
NORTHWESTERN POLYTECHN UNIV ZHANGJIAGANG INTELLIGENT EQUIP TECH INDZATION RES INST
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Problems solved by technology
[0002] The electronic component testing device can distinguish which are finished products and which are defective products after the electronic components are tested. These finished products and defective products need to be screened during the discharge process. The current screening mechanism has a complicated structure and costs higher
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[0015] The present invention will be further described now in conjunction with accompanying drawing. These drawings are simplified schematic diagrams only to illustrate the basic structure of the present invention in a schematic way, so they only show the components relevant to the present invention.
[0016] Such as Figure 1 to Figure 4 As shown, an electronic component testing device with a new discharge mechanism includes a base 1, the front end of the base 1 forms a test station, the middle part of the base 1 forms a discharge station, and the rear end of the base 1 is provided with a discharge mechanism.
[0017] The discharge mechanism includes a herringbone material box 2, and a herringbone material trough is formed in the material box 2. The herringbone material trough includes a guide trough at the upper end and two finished product troughs and a defective product chute at the lower end. The material box 2 guide chute The discharge station is located on the base 1, ...
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The invention relates to an electronic element testing device with a novel discharging mechanism. The electronic element testing device comprises a base, a testing station is formed at the front end of the base, a discharging station is formed in the middle of the base, and the discharging mechanism is arranged at the back end of the base. The discharging mechanism comprises an inverted-V-shaped material box, and an inverted-V-shaped material tank is formed in the material box. The inverted-V-shaped material tank comprises a guiding tank at the upper end and a finished product tank and a defective product tank, wherein the finished product tank and the defective product tank are located at the lower end. The material box is obliquely mounted on the base, and the guiding tank is located atthe high end. A guiding plate is arranged on the position, at the bottom of the junction of the two inlet ends of the finished product tank and the defective product tank, on the material box, and theguiding plate can move back and forth in the inlet ends of the finished product tank and the defective product tank through a rotating shaft. The guiding plate is driven by an air cylinder to rotateso as to control the opening and closing conditions of the finished product tank and the defective product tank, and thus when electronic elements in the guiding tank slide downwards, finished products and defective products can pass through the finished product tank and the defective product tank correspondingly through the guiding plate.
Description
technical field [0001] The invention relates to an electronic component testing device with a novel discharging mechanism. Background technique [0002] The electronic component testing device can distinguish which are finished products and which are defective products after the electronic components are tested. These finished products and defective products need to be screened during the discharge process. The current screening mechanism has a complicated structure and costs higher. Contents of the invention [0003] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide an electronic component testing device with a new type of discharging mechanism. [0004] The technical solution adopted by the present invention to solve the technical problem is: an electronic component testing device with a new type of discharging mechanism, including a base, the front end of the base forms a testing station, and the mi...
Claims
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Inventor 徐健
Owner NORTHWESTERN POLYTECHN UNIV ZHANGJIAGANG INTELLIGENT EQUIP TECH INDZATION RES INST