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Method for determining total dose resistant capacity of device by combining ground and on-orbit environments

A technology of anti-total dose and determination method, applied in environmental/reliability testing, instruments, measuring electricity, etc., to achieve accurate results

Active Publication Date: 2018-02-09
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem solved by the present invention is: to overcome the deficiencies of the existing methods, to provide a method for determining the anti-total dose radiation capability of the device combined with the ground and on-orbit environment, and to make up for the inaccurate determination of the anti-total dose radiation ability of the device only through the ground test The problem

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  • Method for determining total dose resistant capacity of device by combining ground and on-orbit environments
  • Method for determining total dose resistant capacity of device by combining ground and on-orbit environments
  • Method for determining total dose resistant capacity of device by combining ground and on-orbit environments

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Embodiment

[0082] In the example of the present invention, a certain spacecraft is taken as an example. Its orbit type is sun-synchronous orbit, the average orbit height is 800 kilometers, the design life is 3 years, and the operating time in orbit is the year of high solar activity. The equivalent thickness of the spacecraft structural plate is 2mm, and the equivalent aluminum thickness of the electronic equipment shell where the device is located is 2.5mm, that is, the total equivalent aluminum shielding thickness is 4.5mm. According to the radiation dose-depth relationship table (as shown in Table 1), the captured electron dose D was determined respectively e 6.48×10 2 rad(Si), bremsstrahlung dose D b 2.25×10 1 rad(Si), captured proton dose D p 6.93×10 2 rad(Si), solar flare proton dose D s-p 1.01×10 2 rad(Si).

[0083] Table 1 Particle-induced radiation dose-depth relationship in the sun-synchronous orbit at an altitude of 800 km (3 years, year with high solar activity)

[00...

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Abstract

The invention relates to a method for determining the total dose resistant capacity of a device by combining ground and on-orbit environments. The method comprises the steps of determining on-orbit ionization radiation total dose environmental parameters of the device, determining a performance test dose point of a ground irradiation test of the device and a dose rate of the irradiation test according to the on-orbit ionization radiation total dose parameters, determining an ionization radiation total dose sensitive parameter of the device through the ground irradiation test, conducting an on-orbit test on the device, detecting variations of the sensitive parameter of the device and the ionization radiation total dose value borne by the device in real time, and thus determining the ionization radiation total dose resistant capacity of the device. The method determines the ionization radiation total dose resistant capacity of the device is determined by combining the ground irradiationtest and the on-orbit environment, and has the characteristic of being more accurate.

Description

technical field [0001] The invention relates to a method for determining the anti-total dose capability of a device based on the combination of ground and on-orbit environmental parameters. Background technique [0002] Spacecraft operating in orbit will be radiated by electrons, protons, and a small amount of heavy ions from the Earth’s radiation belts, galactic cosmic rays, and solar cosmic rays. Devices sensitive to these radiations will have an ionizing total dose effect, causing their performance parameters to change. Changes that affect its normal operation. However, different spacecraft orbits and different on-orbit times have a greater impact on spacecraft radiation due to differences in solar activities and cosmic celestial body activities. The radiation dose received by devices in the space environment has great uncertainty, and the ground conditions are completely simulated and complex. At the same time, the radiation damage of the total ionizing dose of the devi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/003G01R31/008
Inventor 王文炎杜卓宏李鹏伟韩晓东丁丽娜刘艳秋张雷浩张皓源张洪伟
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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