System and method for multiple intelligence test
A test system and test method technology, applied in the direction of instruments, electrical operation teaching aids, data processing applications, etc., can solve problems such as low reliability, inability to provide multiple intelligence test test methods, and distorted answers
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[0022] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art to which the present invention pertains can easily implement. However, the present invention can be realized in various forms, and is not limited to the embodiments described here. In addition, in the drawings, in order to clearly describe the present invention, parts irrelevant to the description are omitted, and similar reference numerals are assigned to similar parts throughout the specification.
[0023] Throughout the specification, when it is described that a certain part is "connected" to other parts, this includes not only the case of "direct connection" but also the case of "electrically connecting" with other elements interposed therebetween. In addition, when it is described that a certain part "includes" a certain constituent element, unless there is a particular statement to the contrary, it means that ot...
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