Methods and apparatus to detect and correct errors in destructive read non-volatile memory
A non-volatile, memory-based technology applied in the field of errors in non-volatile memory, capable of solving problems such as no longer usable, damaged, deformed, etc.
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[0013] Example methods and apparatus disclosed herein relate to correcting data symbol errors caused by power change events during read, write, and / or write-back operations in destructively read non-volatile memory Occurs when the memory for is corrupted (for example, corrupted). As used herein, the term "power change event" is defined to include any fluctuation in voltage, current, power, etc., such as a total loss of power (e.g., a mains outage), a reduction in power (e.g., a brownout), an increase in power ( For example, power surges), or other fluctuations from a constant supply of power.
[0014] During a typical digital device power-up process such as may be performed by a processor, the device is connected to a power source, allowed to stabilize, boots from non-volatile memory, and begins normal operation. If a power change event occurs during the power-on process, the device repeats the power-on process. If the contents of the non-volatile memory are not affected by ...
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