Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Circuit structure of chip

A circuit structure and circuit technology, which is applied in the field of semiconductors, can solve the problems of not having the open circuit protection function of the sampling resistor, the output current of the power device cannot be constant, and the damage is caused.

Pending Publication Date: 2018-09-14
XIAMEN YUANSHUN MICROELECTRONICS TECH +1
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The sampling resistor will be burnt due to improper power selection or other reasons, forming an open circuit, so that the output current of the power device in the corresponding chip cannot be constant, resulting in damage and damage to the power device (for example, the flashing phenomenon of a certain LED light ), and then cause more serious consequences (for example, the entire LED light string is burned, or the entire LED driver chip is burned)
However, the circuits of chips currently on the market do not have the open-circuit protection function of the sampling resistor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Circuit structure of chip
  • Circuit structure of chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The existing chip does not have an open-circuit protection structure for the sampling resistor. Taking the LED driver chip on the market as an example, most of the LED driver chips only monitor the light string of the LED lamp, and do not monitor the sampling resistor, so they cannot be damaged when the sampling resistor is damaged. Protect the chip. At this time, if the sampling resistor is burned due to improper power selection and other reasons, resulting in an open circuit, it may cause the LED light to flicker, and then cause the entire light string and driver chip to be burned.

[0019] Therefore, the present invention provides a circuit structure of a chip to solve the above-mentioned shortcomings.

[0020] For a clearer representation, the present invention will be described in detail below in conjunction with the accompanying drawings.

[0021] An embodiment of the present invention provides a circuit structure of a chip, including a functional device (not mar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A circuit structure of a chip comprises a functional device and a sampling resistor, wherein the functional device is serially connected with the sampling resistor; the sampling resistor is used for achieving constant current of the functional device; the circuit structure of the chip further comprises an open circuit protection circuit; an access point of the open circuit protection circuit is connected with the sampling end of the sampling resistor; the open circuit protection circuit is used for protecting the functional device from being affected when the sampling resistor encounters an open-circuit failure.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a circuit structure of a chip. Background technique [0002] In the circuit of some chips (such as the circuit of the LED driver chip), it is usually necessary to connect an external sampling resistor to collect the current flowing through the corresponding power device (the power device can be the corresponding LED lamp or LED lamp string), so that the corresponding current Feedback to the chip in time to achieve constant current. [0003] The sampling resistor will be burnt due to improper power selection or other reasons, forming an open circuit, so that the output current of the power device in the corresponding chip cannot be constant, resulting in damage and damage to the power device (for example, the phenomenon of flashing of a certain LED light ), which in turn causes more serious consequences (for example, the entire LED light string is burned, or the entire LED driver ch...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H05B33/08H05B44/00
CPCH05B45/50Y02B20/30
Inventor 刘圭彭军其方绍明
Owner XIAMEN YUANSHUN MICROELECTRONICS TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products