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Test method and apparatus

A test method and test device technology, applied in the field of cloud computing, can solve problems such as degraded user experience and complex deployment structure

Inactive Publication Date: 2018-11-30
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Multiple test nodes are tested according to the corresponding platforms, which realizes a compatible testing mechanism and solves the problem of declining user experience caused by the complex deployment structure of cloud products

Method used

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  • Test method and apparatus
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Embodiment Construction

[0030] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0031] The steps shown in the flowcharts of the figures may be performed in a computer system, such as a set of computer-executable instructions. Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0032] Factors such as the disk performance and communication network quality of each host on which cloud products are deployed will seriously affect the user experience of cloud products.

[0033] In order to solve the above problems, embodiments of the ...

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Abstract

The invention discloses a test method and apparatus, and relates to the field of cloud computing. The problem of reduced user experience caused by the complex deployment structures of cloud products is solved. The method comprises the following steps: logging in a plurality of test nodes; and respectively testing the test nodes according to a test platform corresponding to the test nodes. The technical solution provided by the invention is applicable to cloud products and implements a compatible test mechanism.

Description

technical field [0001] The invention relates to cloud computing technology, in particular to a testing method and device. Background technique [0002] In the era of cloud computing, it is very important for enterprises to develop a set of cloud products with stable and reliable performance and quickly occupy the market. The deployment of cloud products is basically a large-scale, high-volume deployment. Generally speaking, in order to use advanced features such as high availability of cloud products, cluster storage is basically the first choice. Factors such as the disk performance and communication network quality of each host on which cloud products are deployed will seriously affect the user experience of cloud products. Contents of the invention [0003] In order to solve the above technical problems, the present invention provides a testing method and device. Multiple test nodes are tested according to the corresponding platforms, a compatible testing mechanism i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26H04L29/08
CPCH04L43/0817H04L67/10
Inventor 马怀旭
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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