Device and method for removing white patches on surface of material

A white spot and laser technology, applied in the field of white spot devices

Active Publication Date: 2018-12-14
HEFEI LCFC INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the removal of white spots by the above method will cause the re-induction of chemical residual stress due to the use of solvents.

Method used

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  • Device and method for removing white patches on surface of material
  • Device and method for removing white patches on surface of material
  • Device and method for removing white patches on surface of material

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Embodiment Construction

[0023] Below, specific embodiments of the present invention will be described in detail in conjunction with the accompanying drawings, but they are not intended to limit the present invention.

[0024] It should be understood that various modifications may be made to the embodiments disclosed herein. Accordingly, the above description should not be viewed as limiting, but only as exemplifications of embodiments. Those skilled in the art will envision other modifications within the scope and spirit of the disclosure.

[0025] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and, together with the general description of the disclosure given above and the detailed description of the embodiments given below, serve to explain the embodiments of the disclosure. principle.

[0026] These and other characteristics of the invention will become apparent from the following description of preferred...

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PUM

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Abstract

The invention provides a device for removing white patches on the surface of a material caused by the thermal residual stress. The device comprises a laser, an X galvanometer, a Y galvanometer and a focus lens, wherein the X galvanometer is used for reversing a laser light from the laser; the Y galvanometer is used for reversing the laser light processed through the X galvanometer; and the focus lens is used for adjusting the light intensity of the laser light processed through the Y galvanometer and guiding the laser subjected to light intensity adjustment to the surface of the material, so that the white patches on the surface of the material are removed. The laser light emitted by the device provided by the invention can be used for melting the white patches on the surface of the material, and the material around the white patches can be fuzzified through the cooperation of the focus lens in the device, so that the crystalline state is recovered to the amorphous state, the aim of removing the white patches is achieved, and the generation of other residual stresses cannot be triggered.

Description

technical field [0001] The present invention relates to a device, more specifically, to a device and method for removing white spots caused by thermal residual stress on the surface of a material. Background technique [0002] At present, hot and cold in the process of material manufacturing or post-processing, or long-term heating / cooling will cause thermal residual stress in the material, and for plastic or polymer materials, thermal residual stress will often make the material Certain components or small additives are induced to crystallize or atomize to precipitate white spots on the surface of the material. The general method for removing white spots in the industry is to wipe the white spots with a solvent (such as alcohol) so that the appearance after wiping is consistent with the color of the surrounding area, then put it in an oven, and dry it to remove the solvent. However, the removal of white spots by the above method will cause the generation of chemical residu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B23K26/00B23K26/352
CPCB23K26/00B23K26/352
Inventor 邓拔龙
Owner HEFEI LCFC INFORMATION TECH
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