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A Reliability Assessment Method for Common Cause Failure Systems Considering Environmental Factors

A technology of environmental factors and reliability, applied in instruments, probabilistic networks, design optimization/simulation, etc., can solve problems such as errors in reliability assessment methods

Inactive Publication Date: 2021-02-02
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the above-mentioned deficiencies in the prior art, the present invention provides a common cause failure system reliability assessment method considering environmental factors, which solves the problem that the reliability assessment method of the existing common cause failure system has large errors

Method used

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  • A Reliability Assessment Method for Common Cause Failure Systems Considering Environmental Factors
  • A Reliability Assessment Method for Common Cause Failure Systems Considering Environmental Factors
  • A Reliability Assessment Method for Common Cause Failure Systems Considering Environmental Factors

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Embodiment Construction

[0029]The following describes the specific embodiments of the present invention to facilitate those skilled in the art to understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments, for those of ordinary skill in the art, as long as various changes These changes are obvious within the spirit and scope of the present invention defined and determined by the appended claims, and all inventions and creations that utilize the concept of the present invention are protected.

[0030]The actual engineering system of the present invention is such asfigure 2 As shown, the system S consists of two key components A with the same functional structure1, A2In series composition, their failure obeys exponential distribution, and two key components will be affected by the same environmental stress, so there is a common cause failure phenomenon. There are non-critical components N in the system. Failure of non-critical comp...

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Abstract

The invention discloses a method for evaluating the reliability of a common cause failure system considering environmental factors. The invention fully considers the common cause failure and failure rate change of the modern complex system due to the characteristics of multi-task profile, complex environment and multiple components. Therefore, compared with the traditional system reliability evaluation method which assumes that component failures are independent and not affected by the environment, the present invention has more engineering value. At the same time, because the present invention uses the dynamic Bayesian network modeling method, it can reason complex systems, making the method suitable for reliability evaluation of large complex systems.

Description

Technical field[0001]The invention relates to the technical field of system reliability engineering, in particular to a common cause failure system reliability assessment method considering environmental factors.Background technique[0002]Common Cause Failure (CCF) is a type of problem often encountered in actual engineering systems. It refers to the simultaneous failure of two or more units in a system due to a common cause. The main feature is the correlation of failures. For some systems, the failure process of its components is often correlated, and the failure correlation of common cause failure is an important reason that causes the failure of each part of the system. Most of the existing reliability assessment methods are based on the assumption that system component failures are mutually independent, ignoring the correlation of system component failures, and simply perform qualitative analysis and quantitative calculations on the system under the assumption that each part of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06N7/00G06F111/08G06F119/02
CPCG06F30/20G06N7/01
Inventor 黄洪钟刘洋黄鹏李彦锋王琪瑞丁如昌曾颖
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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