Display panel testing circuit, system and method

A display panel and test circuit technology, applied to static indicators, instruments, etc., can solve the problem that the defect detection ability of the grid signal of the display panel cannot be improved
CN109448620BActive Publication Date: 2019-10-25CHENGDU ZHONGDIAN PANDA DISPLAY TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHENGDU ZHONGDIAN PANDA DISPLAY TECH CO LTD
Publication Date
2019-10-25

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Abstract

The embodiment of the application provides a display panel test circuit, a system and a method. The circuit includes: a first linkage unit for receiving a test drive signal; a second linkage unit forreceiving a test control signal; and a first gate trace and a second gate trace which are connected to the first linkage unit. The first gate trace and the second gate trace are respectively used forconnecting to one end of a first gate drive wire and one end of a second gate drive wire. The other ends of the first gate drive wire and the second gate drive wire are both connected to a control endof a drive control device of a display panel. A controllable component is connected in series on the first gate trace and / or the second gate trace. A control end of the controllable component is connected to the second linkage unit. The circuit provided by the embodiment can help solve the problem that the gate signal defect detection capability of a display panel driver cannot be improved in theprior art.
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Description

technical field

[0001] The embodiments of the present application relate to the technical field of display panel testing, and in particular to a display panel testing circuit, system and method. Background technique

[0002] The TFT LCD (Thin Film Transistor Liquid Crystal Display) industry has gradually developed towards large size and high definition. In order to meet the panel drive capability, the gate drive lines are designed with bilateral drive on both sides.

[0003] In the actual panel manufacturing process, in order to check the performance of the panel after the Array (array) process is completed, it is necessary to configure a test circuit for testing during the panel design. Due to the traditional large-size wiring design, the Gate (gate) wiring uses The test driving method is to drive the upper and lower sides at the same time to avoid distortion caused by signal attenuation. However, when the double-drive test circuit is used for inspection, the traditional ci...

Claims

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