Blocking inspection method and device for electric-leakage bright spots

Abstract

A blocking inspection method and device for electric-leakage bright spots, comprises: providing a driving circuit of a data line and guiding in grid electrode drive of a grid electrode side, electrically connecting a terminal area of the grid electrode side through conducting paste; after dividing the terminal area of the grid electrode side into a first area and a second area, opening a pixel electrode switch, and transmitting driving signals to a data side; and blocking and inspecting the electric-leakage bright spots by selectively driving conducting terminals in the first area or the second area of the grid electrode side. The blocking inspection device for the electric-leakage bright spots, by providing the driving circuit of the data line, enabling the terminal area of the grid electrode side to be electrically connected through the conducting paste, opening the pixel electrode switch, transmitting the driving signals to the data side and blocking and inspecting the electric-leakage bright spots by selectively driving conducting terminals in different areas of the grid electrode side, has the advantage that the electric-leakage bright spots can be blocked and inspected at a Cell section conveniently and fast, so that the defect checkout capability of the system is enhanced, the product yield is increased, leakage is reduced, and the cost is saved.

Description

technical field [0001] The invention relates to the technical field of liquid crystal panels, in particular to a method and a device for detecting electric leakage points. Background technique [0002] The leakage bright spot of TFT-LCD (Thin Film Transistor-Liquid Crystal Display) panel refers to the bright spot formed by the leakage of TFT switch. refer to figure 1 , figure 1 It is a schematic diagram of the abnormal structure of the TFT switch; figure 1 As shown, when the TFT switch is abnormal, bright spots will appear on the LCD panel, which will affect the use effect of the LCD panel. [0003] Considering the detection cost, the existing technology still adopts 1D1G lighting method to detect it in the cell process stage of the liquid crystal panel, that is, to provide a driving circuit for the data line, and whether the conductive terminal electrically connected to the gate side through conductive glue is enabled Cooperate to detect leakage points; but the 1D1G lig...

AI Technical Summary

Problems solved by technology

It can be seen that in the prior art, the cell process of the liquid crystal panel cannot detect potential leakage points caused by damage to the TFT switch.

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