Total station instrument and star pattern recognizing method thereof

A technology of star map recognition and total station, which can be applied to instruments, measuring instruments, measuring devices, etc., and can solve problems such as low efficiency of star map recognition.

Active Publication Date: 2019-03-29
PLA STRATEGIC SUPPORT FORCE INFORMATION ENG UNIV PLA SSF IEU
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a total station and its star map recognition method to solve the problem of low star map reco

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  • Total station instrument and star pattern recognizing method thereof
  • Total station instrument and star pattern recognizing method thereof
  • Total station instrument and star pattern recognizing method thereof

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Embodiment Construction

[0042]The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0043] Embodiment of the star map recognition method based on the total station:

[0044] A total station-based star map recognition method of the present invention extracts the centroids of continuous stellar images at different times, and fits the trajectory of star image points according to the centroids extracted at each time, and then can be set The image point coordinates of the stars at the moment, and in conjunction with the pixel coordinates of the total station and the dial coordinate conversion model, calculate the observation horizontal angle and altitude angle of the stars at the set moment; wherein, in the present invention, at least three stars need to be calculated respectively The observed horizontal angle and altitude angle at the set time; then, according to the obtained observed horizontal angle and altitude angle of at le...

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Abstract

The invention relates to a total station instrument and a star pattern recognizing method thereof. The star pattern recognizing method comprises: continuously photographing a star through the total station instrument to obtain the motion track of the star on an image surface, and fitting a track through a polynomial; extrapolating the image point coordinate of the star at the set time according tothe fitted track model, and obtaining the observed horizontal angle and height angle of at least three stars the total station instrument image coordinate and the dial coordinate conversion model; calculating the angular distance information between any two stars, and setting a reasonable threshold value by using the angular distance information as a matching condition to complete the matching and recognize the star in the star pattern. According to the total station instrument and the star pattern recognizing method thereof, the star pattern recognition of the total station instrument without the rough position of the station can be realized, so that the star pattern recognition can be performed by an astronomical survey operator without the professional knowledge of star pattern recognition.

Description

technical field [0001] The invention belongs to the field of astronomical image processing, and in particular relates to a total station and a star map recognition method thereof. Background technique [0002] Astronomical measurement is a technology that relies on natural celestial bodies such as stars, planets, the sun, and the moon to achieve precise positioning and orientation. It has strong autonomy and anti-interference, and can be used as an important backup method for satellite navigation systems. [0003] At present, the classic star map identification requires a star map to contain multiple star points, and the angular distance information between stars is used for identification, but astronomical survey operators need to conduct star map The recognition of the star map is relatively low. [0004] With the increasing maturity of image total station technology, its automatic camera function can replace the human naked eye to realize automatic observation of natural...

Claims

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Application Information

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IPC IPC(8): G01C15/00G01C21/02
CPCG01C15/00G01C21/025
Inventor 詹银虎郑勇张超李崇辉叶凯米科峰
Owner PLA STRATEGIC SUPPORT FORCE INFORMATION ENG UNIV PLA SSF IEU
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