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59 results about "Star pattern" patented technology

Outfield precision testing method for high-precision star sensor

The invention discloses an outfield precision testing method for a high-precision star sensor. Accuracy in calculation of a star pattern posture of the star sensor and frequency domain stripping of short-period error terms of the posture are realized by utilizing a procession correction formula, an earth rotation model, an atmosphere correction model and a power spectral density formula, and the posture measuring error of the star sensor can be rapidly and effectively analyzed and evaluated. According to the method, the hardware resource is not occupied, the method is realized by utilizing software and does not need the ground intervention. According to the method, by combining the posture identification principle of the star sensor and adopting a data smoothing method, the posture truth value of each frame star pattern moment is calculated, so that a foundation is established for the subsequent analysis on the posture measuring error; by adopting the method for combining the time domain and the frequency domain, the short-period error term is decomposed into an airspace low-frequency error, a high-frequency error and a time-domain error by virtue of the power spectral density analysis, so that reasonable data support is provided for further evaluation of the precision indexes of the star sensor, and the index performance of the star sensor can be improved.
Owner:BEIJING INST OF CONTROL ENG

Star pattern identification method and star pattern identification device of hybrid redundancy feature

The invention discloses a star pattern identification method of a hybrid redundancy feature. The star pattern identification method comprises the following steps of: based on the geometric position relation of the navigation star points, establishing a hybrid redundancy pattern feature of a navigation reference star point, and then, creating a binary feature database of the navigation reference star point; based on the geometric position relation of a star map and the star points, calculating the hybrid feature of the star map reference star point; according to the hybrid feature of the star map reference star point, selecting candidate star points corresponding to the star map reference star point from the binary feature database by using similar score measurement; by a maximum matching pair algorithm, selecting a matched star point for the star map reference star point from all the candidate star points. The invention also discloses a star pattern identification device of the hybrid redundancy feature. With the method and the device, high accurate identification rate can be realized under the condition of high star point position noise and star magnitude noise, moreover, acquisition of the matched star point is guaranteed when few accompanying star points exist in the radius of the navigation star point pattern.
Owner:BEIHANG UNIV

Diamond with double five-pointed-star patterns seen from facet and processing method

The invention discloses a diamond with double five-pointed-star patterns seen from a facet and a processing method; the diamond comprises a crown part, a waist part and a bottom part, wherein the bottom part comprises ten large prismatic sharp faces, ten bottom foot faces and five small prismatic pointed faces which are uniformly arranged by taking the sharp points as the centers, and the crossededges of the five small prismatic sharp faces and the ten large prismatic sharp faces are connected end to end to form a first five-pointed-star pattern; a small bottom foot face is arranged relativeto each angle A of the first five-pointed-star pattern patter, and a second five-pointed-star pattern which is smaller than the first five-pointed-star pattern is formed by the five bottom foot faceson the facet in a reflection mode; and an included angle between the connecting line of the angle A of the first five-pointed-star pattern and the sharp points and the connecting line of the angle B of the second five-pointed-star pattern and the sharp points is 36 degrees. When observed under a light cutting mirror, a large five-pointed-star pattern and a large five-pointed-star pattern are represented on the facet of the diamond, the color of the second five-pointed-star pattern is darker than that of the first five-pointed-star pattern, and the included angle between the two patterns is 36degrees.
Owner:上海爱豪钻石有限公司

Star pattern identification method by combining with neural network technology and triangle algorithm

The invention discloses a star pattern identification method by combining with a neural network technology and a triangle algorithm. During operation of a star sensor, under condition without prior attitude, all-sky star pattern identification is carried out by employing the method provided by the invention. For a screened star database, a characteristic vector is constructed according to the distribution characteristic of the adjacent star of each star, the nerve network technology is employed for constructing a classification network, all stars in a star catalogue are classified, and the triangle information each star and triangle information of the adjacent star are stored in a triangle database. During star pattern identification, the characteristic vector of the to-be-identified starcan be generated, a most similar type is output through the classification network, and the triangle algorithm is used in the triangle database corresponding to the most similar type to find the coupled triangle. After the validation succeeds, the identification attitude is output. The star pattern identification method has the advantages of small storage content, fast identification speed, high recognition rate, and strong anti-interference performance.
Owner:SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI

Star pattern recognition method applicable to shipborne super-wide field-of-view celestial navigation system

InactiveCN108469261ASolve the problem of a sharp increase in the amount of recognition calculationsReduce complexityNavigational calculation instrumentsNavigation by astronomical meansStar patternStar pattern recognition
The invention discloses a star pattern recognition method applicable to a shipborne super-wide field-of-view celestial navigation system. The method comprises the steps that for a star pattern shot bya fisheye camera, ten concentric circles are drawn around the center of the field of view in different radii, the field of view is divided into ten annular and circular regions, and it is guaranteedthat the areas of all the regions are the same; in the process of constructing a guide star database, the star angular distance serves as the characteristic to sectionally store the guide star database to be multiple characteristic sub-libraries; in the recognition process, a proper-star-based multiple triangular recognition algorithm is applied, recognition is conducted from the circular region in the center of the field of view to the annular region on the edge of the field of view in sequence, and meanwhile the guide star database is retrieved rapidly according to the observation star angular distance. The method is applied to the shipborne super-wide field-of-view celestial navigation system, the good real-time property and recognition rate are achieved, and more efficient and accuratemarine celestial navigation can be achieved.
Owner:TIANJIN UNIV

Star pattern recognition method based on radial triangle mapping matrix

ActiveCN113483751AMake up for the shortcomings of needing to select a large number of triangles for storageAvoid spaceNavigation by astronomical meansEnergy efficient computingStar patternStar pattern recognition
A star pattern recognition method based on a radial triangle mapping matrix comprises the following steps of: extracting a radial triangle mode of a navigation star, and establishing a navigation star mode library; constructing a radial triangle formed by a main star as a vertex and any two adjacent stars in a mode radius according to the geometric distribution of observation stars extracted from a star pattern; mapping the angular distance of the radial triangle to a mode matrix; completing voting through matching of the grids of the mode matrix; selecting high-vote candidate stars as main star labels through voting; for individual low-vote and equal-vote candidate stars, determining a rotation matrix and an attitude angle by using double-loss attitude determination; and verifying the radial triangle through a reprojection method, and outputting an observation star verification identification result to obtain a star label. Other Nmax to-be-recognized stars close to the main point of the star pattern are recognized in the same way. According to the method, the robustness of a triangle algorithm is inherited, meanwhile, a pattern matrix with rotation invariance is constructed, the whole pattern library is searched during each radial triangular pattern matching voting, and completeness is achieved.
Owner:BEIHANG UNIV

A method for detecting and characterizing the quality of star-marked printed matter

The invention relates to a method for detecting and characterizing the quality of star-marked printed products, which belongs to the technical field of printing / printout; it includes the following steps: (1) 36 pairs of equiangular wide bright lines and dark lines radiating from one point to the surroundings The star pattern and its surrounding symmetrical straight line segments are used as the digital manuscript; (2) output the digital manuscript to obtain the detection pattern of the star print; (3) calibrate the light reflectance of the imaging system; (4) obtain the star print The RGB digital image of the detection pattern; (5) obtaining the grayscale image of the light reflectance; (6) extracting and quantifying the quality attribute characteristics of the star mark on the grayscale image of the light reflectance obtained in step (5). The detection and characterization method for the quality of star-marked printed products established by the present invention can quantify and characterize the dark line angle width, the size and shape of the central fuzzy area, and the filling rate of the central area of ​​the star-marked printed products, making it commonly used in visual inspection of printing quality. The star pattern for reviews has quantified quality descriptions.
Owner:BEIJING INSTITUTE OF GRAPHIC COMMUNICATION
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