Product quality testing method and device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GEER TECH CO LTD
- Publication Date
- 2020-11-17
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Abstract
Description
technical field
[0001] The invention relates to the technical field of automatic detection, in particular to a product quality detection method and device. Background technique
[0002] Soldering is a common and important process in the manufacture of electronic devices. Due to the influence of many factors such as production environment, production equipment and production process, various defects will inevitably appear in the welding process, and may further lead to product quality problems. In actual production, common defects include lead lift, no lead, lead offset and so on.
[0003] Along with the strict requirements on the processing technology in the production line, higher requirements are put forward for the detection capability of electronic device defects. Therefore, how to accurately identify whether there are defects in electronic devices is particularly important. Contents of the invention
[0004] In view of this, embodiments of the present invention pro...