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A reliability testing method, device and equipment for storing timing snapshots

A test method and reliability technology, applied in the field of storage management, can solve the problems of ensuring test reliability, inability to take less time, etc.

Active Publication Date: 2022-07-08
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a reliability testing method, device, equipment and computer-readable storage medium for storing timed snapshots, which can solve the problem of the technical solutions for implementing timed snapshot function tests in the prior art that cannot be time-consuming and at the same time Questions to assure test credibility

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  • A reliability testing method, device and equipment for storing timing snapshots
  • A reliability testing method, device and equipment for storing timing snapshots
  • A reliability testing method, device and equipment for storing timing snapshots

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Embodiment Construction

[0034] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0035] see figure 1 , which shows a flowchart of a reliability testing method for storing timing snapshots provided by an embodiment of the present invention, which may include:

[0036] S11: Determine any database that does not currently store data as the target database, and concurrently write multiple randomly generated data into the target database.

[0037] The execution subject of the reliability testing method for storing tim...

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Abstract

The invention discloses a reliability testing method, device, equipment and computer-readable storage medium for storing timing snapshots. The method includes: determining a target database that currently does not store data, and concurrently writing randomly generated multiple data into the target database. determine whether the preset execution time has been reached, and if so, suspend the execution of the timed snapshot task. The timed snapshot task is the task of regularly creating a snapshot corresponding to the target database, and restores the corresponding data based on each snapshot created, and judges each Whether the data restored by the snapshot is consistent with the data written to the destination database at the corresponding snapshot creation time and before the corresponding snapshot creation time, if so, the test is determined to pass, otherwise, the test is determined to fail; if not, return Perform the steps to write data to the destination database. The present application can solve the problem existing in the prior art that the reliability of the test cannot be guaranteed while the time consumption is small.

Description

technical field [0001] The present invention relates to the technical field of storage management, and more particularly, to a reliability testing method, apparatus, device and computer-readable storage medium for storing timing snapshots. Background technique [0002] The VSS (Volume Shadow Copy Service, Volume Shadow Copy Service) service provides a framework for data backup. Based on this service, storage products derive the timed snapshot function, which reduces manual intervention and greatly simplifies the technical threshold for data backup and recovery. In order to ensure the normal realization of the timed snapshot function, it is usually necessary to test the reliability of the timed snapshot function. In the prior art, the reliability test of the timed snapshot function is generally performed manually by the staff. During testing, if the amount of data used to implement the reliability test is small, the reliability of the test will be affected. If the amount of d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06F11/14
CPCG06F11/3688G06F11/1448G06F2201/84
Inventor 齐武波葛峰
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD