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Glass defect detection method based on reflective structured light illumination

A structured light illumination and defect detection technology, which is applied to measuring devices, material analysis through optical means, instruments, etc., can solve problems such as inability to obtain high-contrast defect images, inability to realize area array detection, weak scattered light intensity, etc., to achieve Avoid lighting verification tests, improve defect detection efficiency, and enhance the effect of defects

Inactive Publication Date: 2019-07-19
TZTEK TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, this method has the following defects: 1) It needs to adjust the parameters such as the lighting angle and the size of the light source according to the characteristics of the defect. In actual use, a large number of verification tests are required to confirm the optimal working state, which is cumbersome; 2) For the small-sized flaws inside the glass, due to the weak intensity of scattered light, this detection method combined with bright field and dark field still cannot obtain high-contrast flaw images, which requires extremely high requirements for the back-end flaw detection algorithm. ;3) It needs to be used with a line array camera and a linear module, and cannot achieve area array detection

Method used

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  • Glass defect detection method based on reflective structured light illumination
  • Glass defect detection method based on reflective structured light illumination
  • Glass defect detection method based on reflective structured light illumination

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Embodiment 1

[0030] Such as figure 1 , image 3 , Figure 4 Shown, the present invention comprises the steps:

[0031] S1. The structured light source is generated by the liquid crystal display 1. Both the imaging module 2 and the liquid crystal display 1 are placed 200 mm above the glass sample 3 to be inspected. The liquid crystal display 1 displays sinusoidal structural stripes as a structured light illumination source. The glass sample 3 to be inspected Placed on the motion scanning mechanism 4; the motion scanning mechanism 4 can use a conveyor;

[0032] S2. The imaging module 2 is installed obliquely above the glass sample 3 to be inspected, and the lens of the imaging module 2 is adjusted so that the glass sample 3 to be inspected is clearly imaged;

[0033] S3. The liquid crystal display 1 displays images of different phases to control the translation of the display stripes. The structured light stripes are translated 4 times, and each translation distance is 1 / 4 of the period o...

Embodiment 2

[0045] Such as Figure 2 ~ Figure 4 As shown, the fringe projection module 5 projects sinusoidal stripes on the surface of the ground glass screen 6 as a structured light illumination source. The ground glass screen 6 is placed 200 mm above the glass sample 3 to be inspected, and the imaging module 2 is installed on the glass sample 3 to be inspected. Obliquely above, the glass sample 3 to be inspected is placed on the belt conveying mechanism 4, the stripe projection module 5 is located above the frosted glass screen 6, the lens used in the imaging module 2 is a Sham lens, and the object plane of the lens is exactly located on the glass sample to be inspected 3 surface, the Sham angle of the lens can be adjusted to adapt to different object working distances; the fringe projection module 5 projects fringe images of different phases to control the translation of the displayed fringes, each shifting 1 / 4 of the fringe cycle, Then the imaging module 2 collects 4 times to obtain 4...

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Abstract

The invention provides a glass defect detection method based on reflective structured light illumination. The glass defect detection method based on the reflective structured light illumination has advantages of simple in configuration and convenient in detection. The effect of reducing the defects is obvious and the array detection is achieved. A glass sample waiting to be detected forms an imagethrough an imaging module, and a glass sample waiting to be detected of the obtained image is modulated by a structured light source, so a modulation degree distribution map and a phase gradient distribution map are acquired. Through the modulation degree distribution map and the phase distribution map, reducing defects in internal and external parts of various glasses are realized, so array detection is achieved and defect detection efficiency is improved.

Description

technical field [0001] The invention relates to an online glass defect detection method, in particular to a glass defect detection method based on reflective structured light illumination. Background technique [0002] In the process of glass production and assembly, defects such as bubbles, stones, distortion, cracks and scratches will occur inside and outside the glass, and these defects will affect the function and aesthetics of glass products. Among them, for large-sized glass defects, the combination of high-brightness line light source and line array camera can be used to realize the lighting structure of bright field and dark field, which can significantly enhance the defect features in the image, thus achieving a good detection effect. [0003] However, this method has the following defects: 1) It needs to adjust the parameters such as the lighting angle and the size of the light source according to the characteristics of the defect. In actual use, a large number of ...

Claims

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Application Information

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IPC IPC(8): G01N21/958
CPCG01N21/958
Inventor 骆聪袁春辉杨鹏
Owner TZTEK TECH