3results about How to "Improve defect detection efficiency" patented technology

This invention discloses a machine vision quality inspection method for semiconductor equipment component manufacturing, relating to the field of visual quality inspection technology. The method includes the following steps: converting component images to grayscale to obtain a component grayscale image; obtaining a background threshold based on images of a first number of normal components; obtaining a component threshold based on images of the first number of normal components; obtaining a region to be inspected based on the background threshold and the component grayscale image; performing binarization processing on the region to be inspected based on the component threshold to obtain a region binarization image; determining whether an abnormal region exists based on the region binarization image; if an abnormal region exists, obtaining the abnormal location, issuing a defect signal, and simultaneously displaying the abnormal location; if no abnormal region exists, issuing a defect-free signal. This invention addresses the problem in existing technologies where methods are cumbersome when dealing with multiple components, resulting in low efficiency in defect detection of semiconductor equipment components.

This application provides a method, apparatus, device, system, and electronic terminal for detecting display modules. The method includes controlling the display module to be tested to be illuminated based on preset grayscale data; the display module to be tested includes multiple LEDs arranged in an array; acquiring a display image of the display module to be tested in the illuminated state as the image to be tested; detecting the image to be tested to obtain detection information for each LED; the detection information includes optical data and appearance data; and performing optical defect detection and appearance defect detection based on the LED detection information to obtain the detection result of the display module to be tested. This application, by acquiring a display image of the display module to be tested in the illuminated state under preset grayscale data, can quickly realize optical defect detection and appearance defect detection based on the optical data and appearance data of the LEDs, improving the defect detection efficiency of the display module; and compared with the prior art, it also reduces the cost of the detection equipment.

This application provides a method, apparatus, device, system, and electronic terminal for detecting display modules. The method includes sequentially capturing images of the display module under different conditions at a preset location to obtain a first image to be detected and a second image to be detected; performing optical inspection on the first image to be detected to obtain optical inspection information for each LED in the display module; performing appearance inspection on the second image to be detected to obtain appearance inspection information for each LED in the display module; and determining the detection result of the display module based on the optical inspection information and appearance inspection information corresponding to the LEDs in the display module. This application, by acquiring two images of the display module under different conditions, can achieve both optical and appearance defect detection of the display module under test, improving the defect detection efficiency; and compared to existing technologies, it also reduces the cost of the detection equipment.