15results about How to "Improve defect detection efficiency" patented technology

The present application relates to a kind of drug bottle body defect detection equipment and detection method, and it is related to the technical field of medical instrument detection;Including detection platform, medicine bottle conveying part and angle adjusting component;Medicine bottle conveying part includes two clamping conveyors, and clamping conveyor is equipped with clamping block at equal intervals;Angle adjusting component includes two telescopic skeletons, and limit rotating shaft is rotatably arranged at the corner of two telescopic skeletons, and limit rotating shaft on telescopic skeleton is equipped with angle adjusting belt;The present application can solve the following problems existing in the prior art:First, the prior art mainly shoots the image of the whole bottle body, and a large number of pixel points and mosaic will appear in the image when the image is enlarged and detected, which will affect the accuracy of bottle body defect detection, so that some small scratches on the bottle body cannot be effectively identified;Second, the prior art has certain singleness, and it can only detect defects for single size of drug bottle body.

This invention discloses an automatic imaging and defect detection method for capacitor wire mesh applicable to multiple sizes, belonging to the field of industrial automation inspection technology. The method includes the following steps: generating a corresponding imaging path based on the parameter information of the capacitor wire mesh frame to be inspected; controlling the imaging unit to acquire images of the capacitor wire mesh according to the imaging path; identifying regular rectangular wire mesh regions based on region positioning images, and constructing multiple region masks based on these regions; switching between foreground detection regions and background suppression regions between different region masks based on predefined defect types to be detected, and performing defect detection and classification within the corresponding foreground detection regions; generating an inspection report based on structured data; achieving refined partitioning detection through multi-region masks, effectively improving defect detection efficiency and avoiding human subjective errors, reducing the probability of missed and false detections, and accurately identifying various defects such as wire mesh blockage, expansion and contraction, latex peeling, and dirt.

The invention discloses a flaw detection device for new material fiber cloth, which comprises a shell, the front part of the shell is provided with a revolving door which can be opened, the inner wall of the shell is fixedly provided with a support plate, the inner wall of the support plate is rotatably connected with a winding drum through a connecting rod, and the circumferential surface of the winding drum is wound with cloth; the device comprises a shell, an irradiation mechanism, the irradiation mechanism is arranged at the top of the shell, the irradiation mechanism comprises a hydraulic cylinder, a mounting plate is fixedly mounted at the output end of the hydraulic cylinder, and a lamp is mounted on the inner wall of the bottom of the mounting plate. As the photosensitive sensors at the corresponding positions are mounted at the beginning, the device can be directly operated without stopping the machine to edit patterns for comparison, and the detection can be completed only by detecting the light intensity of the photosensitive sensors at the corresponding positions.

This invention provides a defect detection method, a model training method, an apparatus, a device, a medium, and a product. The detection method includes: acquiring an image of a battery cell sealing ring to be inspected, and a defect-free front image and a defect-free back image of a sample battery cell sealing ring; constructing data from the foreground target pixels of the image of the battery cell sealing ring to be inspected, the defect-free front image, and the defect-free back image of the sample battery cell sealing ring to obtain a multi-channel foreground target image; determining the high-level features of the multi-channel foreground target image, the high-level features including: high-level features of the image of the battery cell sealing ring to be inspected, high-level features of the defect-free front image, and high-level features of the defect-free back image; and performing adversarial classification between the high-level features of the image of the battery cell sealing ring to be inspected and the high-level features of the defect-free front image and the defect-free back image, respectively, to obtain a probability value of the battery cell sealing ring image to be inspected containing surface defects.

The invention provides a defect detection method and device, electronic equipment and a storage medium. The detection method comprises the following steps: acquiring a target image comprising a target crystal grain; and through the trained defect detection model, determining a target defect type of the target crystal grain and a target defect region corresponding to the defective part in the target crystal grain in the target image. According to the defect detection model, a segmented training strategy is adopted, so that the accuracy of defect type classification of the model is ensured. And then combined training is carried out for the training images of the crystal grain scene, and the plurality of first projection modules are trained through the training images including the trained crystal grains, so that the adaptability of the model to crystal grain related image processing is improved on the premise of ensuring that the model can accurately classify the defect types and position the defect areas. The trained defect detection model can reduce the misjudgment rate of the model for normal textures and defect textures to a certain extent.

The invention relates to the field of semiconductors, in particular to a wafer defect detection device and method. The device comprises a wafer transfer mechanism, a feeding device, a calibration device, a detection device and a discharging device, the feeding device, the calibration device, the detection device and the discharging device are arranged around the wafer transfer mechanism, and the wafer transfer mechanism comprises a base, a supporting column arranged on the base, a rotating frame rotationally arranged on the supporting column and four wafer transfer frames rotationally arranged at the bottom of the rotating frame. The feeding device transfers wafers to the wafer transfer frame, the discharging device transfers the wafers on the wafer transfer frame out, the calibration device and the detection device receive the wafers on the wafer transfer frame at first, and then the wafers are placed on the wafer transfer frame after calibration and detection are finished. According to the wafer defect detection device, through cooperation of the feeding device, the calibration device, the detection device, the discharging device and the wafer transfer mechanism in the middle, rapid transfer of the wafer among the four procedures is achieved, and the wafer defect detection efficiency is greatly improved.

The application discloses a kind of defect detection method and device of air conditioner fin. Among them, the method includes: after air conditioner fin is executed punch hole operation, the fin image of air conditioner fin is collected, wherein, fin image is the overhead view of air conditioner fin;Hough ellipse detection is carried out to fin image, to obtain all ellipses in fin image;According to the long axis direction of each of all ellipses, all ellipses are divided into regions, to obtain multiple ellipse regions;According to the short axis length of each ellipse in each region in multiple ellipse regions, punch hole defect position in multiple ellipse regions is determined;According to each punch hole defect position, the position of all punch holes of air conditioner fin is determined.The application solves the technical problem that in the related art, air conditioner fin punch process can only rely on quality inspection personnel to detect the performance of fin, cannot be automatically detected, and the efficiency is low.

This invention discloses an intelligent image recognition system and method for cable defects based on artificial intelligence, belonging to the field of image recognition technology. The invention analyzes cable images captured by a high-definition camera using sensors mounted on a robot to collect data on the thickness of the cable overlay. It calculates and judges the cable sag angle, marks the target cable, generates a predicted curve for the overlay thickness based on meteorological data, calculates a predicted curve for the deformation degree of the target cable based on the predicted curve, classifies risk levels and sets warning coefficients based on the deformation rate extracted from the predicted curve, and calculates the priority of the robot for cable defect detection based on the warning coefficient and the deformation degree, driving the robot to plan the detection path.

This invention discloses a machine vision quality inspection method for semiconductor equipment component manufacturing, relating to the field of visual quality inspection technology. The method includes the following steps: converting component images to grayscale to obtain a component grayscale image; obtaining a background threshold based on images of a first number of normal components; obtaining a component threshold based on images of the first number of normal components; obtaining a region to be inspected based on the background threshold and the component grayscale image; performing binarization processing on the region to be inspected based on the component threshold to obtain a region binarization image; determining whether an abnormal region exists based on the region binarization image; if an abnormal region exists, obtaining the abnormal location, issuing a defect signal, and simultaneously displaying the abnormal location; if no abnormal region exists, issuing a defect-free signal. This invention addresses the problem in existing technologies where methods are cumbersome when dealing with multiple components, resulting in low efficiency in defect detection of semiconductor equipment components.

This application provides a method, apparatus, device, system, and electronic terminal for detecting display modules. The method includes controlling the display module to be tested to be illuminated based on preset grayscale data; the display module to be tested includes multiple LEDs arranged in an array; acquiring a display image of the display module to be tested in the illuminated state as the image to be tested; detecting the image to be tested to obtain detection information for each LED; the detection information includes optical data and appearance data; and performing optical defect detection and appearance defect detection based on the LED detection information to obtain the detection result of the display module to be tested. This application, by acquiring a display image of the display module to be tested in the illuminated state under preset grayscale data, can quickly realize optical defect detection and appearance defect detection based on the optical data and appearance data of the LEDs, improving the defect detection efficiency of the display module; and compared with the prior art, it also reduces the cost of the detection equipment.

This application provides a method, apparatus, device, system, and electronic terminal for detecting display modules. The method includes sequentially capturing images of the display module under different conditions at a preset location to obtain a first image to be detected and a second image to be detected; performing optical inspection on the first image to be detected to obtain optical inspection information for each LED in the display module; performing appearance inspection on the second image to be detected to obtain appearance inspection information for each LED in the display module; and determining the detection result of the display module based on the optical inspection information and appearance inspection information corresponding to the LEDs in the display module. This application, by acquiring two images of the display module under different conditions, can achieve both optical and appearance defect detection of the display module under test, improving the defect detection efficiency; and compared to existing technologies, it also reduces the cost of the detection equipment.

The utility model discloses a kind of glass plate surface defect automatic detection devices, it is related to product detection technical field, including detection box, the inside of detection box is equipped with glass plate, the outside of glass plate is equipped with clamping assembly, the top of glass plate is equipped with powder outlet box, and the inside of powder outlet box is equipped with powder, the bottom of one side of powder outlet box is equipped with rubber scraper, the inside of powder outlet box is rotatably equipped with rotating roller, the surface of rotating roller is equipped with three interval uniform powder outlet groove, the top of one side of detection box is equipped with fixed box;The beneficial effects of the utility model are: realized the automatic detection and intuitive marking of glass plate defect, and then improve the efficiency of glass plate defect detection, also greatly reduce the labor intensity of worker, ensure the comprehensiveness and accuracy of detection process, compared with traditional manual detection, can effectively avoid the risk of missed detection and misjudgment, ensure the final glass plate finished product quality.

The invention relates to the technical field of image processing, and provides a lens defect detection method and system based on image processing, and the method comprises the steps: obtaining target background interference feature information of background interference in an initial to-be-detected image of a lens; determining interference information of background interference in the initial to-be-detected image according to the target background interference feature information; suppressing the background interference in the initial to-be-detected image according to the interference information of the background interference to obtain a target to-be-detected image; and recognizing defects of the lens based on the target to-be-detected image. The lens defect detection efficiency can be improved.

The invention provides a defect detection method and equipment for a synthetic chip, and relates to the technical field of defect detection. The defect detection method comprises the following steps: acquiring a to-be-detected micro-nano graph of a synthetic chip, then traversing the to-be-detected micro-nano graph by using a first preset rule, and determining a target area in an abnormal state in the to-be-detected micro-nano graph; and then determining the anomaly type of each target area by using a second preset rule. Wherein the precision of the second preset rule is greater than that of the first preset rule. According to the method, the whole to-be-detected micro-nano graph is traversed through the first preset rule with relatively low precision, the target area in the abnormal state is screened out, and then the abnormal type of the target area in the abnormal state is identified by using the second preset rule with relatively high precision, so that the overall defect detection efficiency is improved while the precision is ensured.

The utility model discloses a chip defect detection device, and belongs to the technical field of chips. A plurality of rows of positioning hole groups are formed in the positioning plate, each row of positioning hole group comprises a plurality of positioning holes, sliding plates are arranged on the surfaces, at the two ends of the positioning holes, of the positioning plate, a plurality of rectangular grooves are formed in the sliding plates side by side, and the lengths of the rectangular grooves are matched with the lengths of the positioning hole groups; the width of the rectangular groove is matched with the diameter of the positioning hole, a connecting block is arranged at one end of the sliding plate, one end of the connecting block is fixed to the sliding plate, a first telescopic rod is arranged at the other end of the connecting block, a fixing base is arranged on the end face of the positioning plate, and the first telescopic rod is fixed to the fixing base. And the output end of the first telescopic rod is fixedly connected to the other end of the connecting block, a rotating motor is arranged on the positioning plate, and the output end of the rotating motor is connected to the positioning plate. According to the technical scheme, the chip defect detection efficiency is improved.