Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Detection device and detection method

A detection device and a technology for detecting images, which are applied in the direction of measuring devices, optical testing of defects/defects, and material analysis through optical means, can solve problems such as low efficiency of manual detection, and achieve improved user experience, increased detection rate, and improved detection The effect of improving the efficiency of

Pending Publication Date: 2019-07-26
SKYVERSE TECH CO LTD
View PDF0 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a problem of low efficiency in manual detection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection device and detection method
  • Detection device and detection method
  • Detection device and detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0068] As described above, the current method of relying on inspectors to manually detect defects of the object under test (such as curved glass) has the problem of low efficiency. In order to solve this problem, the inventor provides a detection device and a detection method after research, which can realize automatic detection for the defects of the object to be tested.

[0069] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a detection device and a detection method. The device comprises a light ray generating device and an imaging device. The light ray generating device comprises a stripe pattern,the device is used for emitting light beams and projecting the stripe pattern to the object to be detected through the light beams, and the stripe pattern comprises a plurality of separated straightstrips which are arranged in parallel; the imaging device is used for obtaining the light beam transmitted or reflected by the object to be detected to form a detection image, and the detection imagecomprises a plurality of stripes; and the detection image is used for acquiring the defect information of the object to be detected according to the stripes. If the surface of the object to be detected is processed ideally and without defects, the detection image obtained by the imaging device should demonstrate straight stripes similar to the stripe pattern. However, if the surface of the objectto be detected has defects, such as orange lines, die scratches, indentations, and the like, the stripes in the detection image are distorted. The detection device can be used for automatically detecting the surface defects of the object to be detected, and compared with the manual detection method in the prior art, the detection efficiency is significantly improved.

Description

technical field [0001] The present application relates to the technical field of defect detection, in particular to a detection device and a detection method. Background technique [0002] Glass materials are widely used in modern industrial manufacturing, such as using glass materials to make mobile phone cases, lenses, battery sheets, and display screens. With the progress and development of processing technology, more and more glass products are designed with curved surface structure, so that the product can better realize the function or achieve a more beautiful effect. [0003] Since the processing of glass curved surfaces requires more and more complicated processes, various defects with different characteristics will inevitably occur during the production process. The common appearance defects include scratches, bumps, mold scratches, orange lines, and indentations. , edge collapse, etc., which affect the function realization and aesthetic effect of the product. Ora...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95G01N21/958
CPCG01N21/95G01N21/958G01N2021/9583
Inventor 陈鲁方一李青格乐
Owner SKYVERSE TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com