Surface defect detection method and device and electronic device

A defect detection and defect-free technology, which is applied in image data processing, instruments, character and pattern recognition, etc., can solve problems such as unguaranteed coverage, limited number of sample images, and inability to detect sample image defects, etc.

Active Publication Date: 2019-12-27
HANGZHOU HIKVISION DIGITAL TECH
View PDF2 Cites 29 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, machine learning requires that the sample image must contain a defective sample image, and the position of the defect on the product needs to be calibrated manually. However, due to the limited num

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Surface defect detection method and device and electronic device
  • Surface defect detection method and device and electronic device
  • Surface defect detection method and device and electronic device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0078] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0079] The traditional surface defect detection method is similar to the traditional machine vision algorithm process, such as figure 1 As shown, generally the captured pictures are preprocessed, then filters are designed to extract features, the extracted features are analyzed and processed to determine the threshold, and defects are detected through morphological and other processing. Since the widespread application of machine learning, the field of surface...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The embodiment of the invention provides a surface defect detection method and device and an electronic device, and the method comprises the steps: obtaining a to-be-detected image; inputting an image to be detected into a deep learning network model obtained through pre-training, obtaining a defect-free reconstructed image corresponding to the image to be detected, and the deep learning networkmodel being a deep learning network model obtained through pre-training based on a sample training set containing multiple defect-free training sample images; subtracting the reconstructed image fromthe to-be-detected image to obtain a difference image; and in the difference image, determining that a surface defect exists in a corresponding region in the to-be-detected image if a region of whichthe difference is greater than a preset difference exists. Through the scheme, the detection rate of the surface defects can be improved.

Description

technical field [0001] The invention relates to the technical field of target detection, in particular to a surface defect detection method, device and electronic equipment. Background technique [0002] Surface defect detection is to judge whether there are spots, pits, color differences, scratches, defects and other defects on the surface of the product. The surface defects of the product have the characteristics of various types, changeable shapes, unstable positions and diverse background textures. In the industrial field, surface defects directly affect the product's aesthetics, performance and other attributes. Therefore, the surface quality of the product is very important. The traditional surface defect detection is to equip a quality inspector on the production line, and the quality inspector conducts quality inspection on the product surface. Inspection, to judge whether there are defects on the surface of the product through human eye observation. However, this m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/20081G06T2207/20084G06T2207/20224G06T7/00G06F18/00Y02P90/30
Inventor 王雪
Owner HANGZHOU HIKVISION DIGITAL TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products