Dynamic random testing method

A testing method and dynamic random technology, applied in the direction of software testing/debugging, etc., can solve the problems of unobtainable and effective testing process, random testing technology lack of testing process improvement, etc., and achieve the effect of convenient application and simple principle

Inactive Publication Date: 2010-01-06
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] (1) The random testing technology lacks the improvement of the testing process, and the most effective testing process cannot be obtained;
[0007] (2) As the test progresses, when the test object changes, the random test technology cannot be adjusted in time to meet the needs of the test

Method used

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Embodiment Construction

[0037] like Figure 1 In the testing process, taking software testing as an example, including software reliability growth testing, software mutation testing and software reliability evaluation process, based on the basic method of classified random testing, the test case set is divided into m equivalence classes, i.e. {C 1 , C 2 ,...,C m}, where the probability of each equivalence class being selected is given by the test profile {p 1 ,p 2 ,...,p m} decides, and Σ i = 1 m p i = 1 .

[0038] Test case equivalence class C is selected i After that, suppose C i k in i test cases, randomly from C i Select a test case for testing, that is, the probability of each test case being selected is

[0039] ε is a parameter for the dynamic adjustment of the test profile, which needs to be given before the test. ...

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Abstract

The invention relates to a dynamic random testing method. The method comprises the following steps: (1), a test case or test object input domain is divided into a plurality of equivalence classes {C1, C2, etc., Cm-1, Cm}; (2), an initial test profile {p1, p2, etc., pm-1, pm} is determined, a test case set Ci is selected at random according to the profile and a test case is selected from the Ci at random for testing; (3), the test profile is adjusted according to the test result, if a defect exists, pi is equal to pi + Epsilon, and the found defect is eliminated at the same time; and if no defect exists, pi is equal to pi-Epsilon, Epsilon is a given parameter before test, and meanwhile, other elements of the test profile are correspondingly corrected so that pi is equal to or more than 0, I is equal to 1, 2, etc., m and *pi is equal to 1; (4), a test case set is selected according to the adjusted test profile, and a test case is selected from the test case set at random for testing; (5), the test profile is adjusted according to the test result and the adjustment rule is same as the step (3); and (6), and so forth, the operation is continued until all defects are found and eliminated or the other test completion conditions are met. The method is simple in principle and convenient in application.

Description

(1) Technical field [0001] The invention relates to a defect testing method, in particular to a dynamic random testing method. It belongs to the technical field of reliability testing. (2) Background technology [0002] Random testing is to select test cases according to a uniform or non-uniform probability distribution in a test case set containing a large number of test cases, and test until all defects are found and eliminated. Classification random testing is to select test cases from a set of equivalence classes known to contain m test cases according to a certain probability distribution in any step of the test, so that the test continues until all defects are eliminated. For example, the test case set contains m equivalence classes {C 1 , C 2 ,...,C m}, where the i-th equivalence class contains ki test cases, the classification random test first randomly selects an equivalence class from the m equivalence classes according to a certain probability distribution, if...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 蔡开元胡海江昌海叶锋郑征
Owner BEIHANG UNIV
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