Defect detection method, system, and apparatus

A defect detection and defect technology, applied in the computer field, can solve problems such as difficult execution, time-consuming and labor-intensive

Pending Publication Date: 2020-01-24
BEIJING BAIDU NETCOM SCI & TECH CO LTD
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Problems solved by technology

This process is time-consuming and labor-

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  • Defect detection method, system, and apparatus
  • Defect detection method, system, and apparatus

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Embodiment Construction

[0038] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.

[0039] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0040] figure 1 An exemplary system architecture 100 to which embodiments of the defect detection method or defect detection apparatus of the present application can be applied is shown.

[0041] Such as figure 1 As shown, the system architecture 100 may include terminal d...

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Abstract

Embodiments of the application disclose a defect detection method, system, and apparatus. The method can be applied to the field of cloud computing. Specifically, a specific embodiment of the method includes: separately inputting images captured under multiple photographing conditions to a target detection model, to obtain multiple first detection results output by the target detection model; foreach of the images captured under the multiple photographing conditions, determining, based on a first detection result output by the target detection model for the image, whether a target object presented in the image has a defect, and if it is determined that there is the defect, using the image as a suspected defect image; and inputting the suspected defect image to a pre-trained neural networkmodel for detection, to obtain a second detection result. The embodiments of the application can filter out the suspected defect image through a fast unsupervised model, thereby reducing a quantity of images input to the neural network model and improving efficiency of defect detection.

Description

technical field [0001] The embodiments of the present application relate to the field of computer technology, specifically to the field of Internet technology, and in particular to a defect detection method, system, and device. Background technique [0002] In the production activities of the traditional manufacturing industry, the status inspection of products, such as the inspection of appearance status, is an important link for manufacturers to control the quality of shipments. Traditional manufacturers will check the status of the product to determine whether the product has flaws and defects, so as to judge whether the notebook produced is a qualified product. [0003] The current methods of quality testing for notebooks include manual testing and optical instrument testing. Among them, the manual detection has low efficiency and poor precision. The detection rules of optical instruments are often solidified into the machine. If the detection rules change, such as the...

Claims

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Application Information

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IPC IPC(8): G01N21/88G06T7/00
CPCG01N21/8851G06T7/0008G06T2207/10004G06T2207/20081G06T2207/20084G06T2207/20021G01N2021/8854G01N2021/888G01N2021/8883G01N2021/8861G01N2021/887G01N2021/8887
Inventor 苏业矫函哲聂磊刘明浩
Owner BEIJING BAIDU NETCOM SCI & TECH CO LTD
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