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Eddy current detecting device used for performing metal defect detection and eddy current probe thereof

An eddy current probe and eddy current detection technology, which is applied to measuring devices, material analysis through electromagnetic means, instruments, etc., can solve the problems that restrict the detection efficiency and defects of the eddy current detection system, so as to improve the detection efficiency of defects, reduce interference and simplify The effect of hardware processing circuits

Active Publication Date: 2013-07-10
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In eddy current testing, defects can only be effectively detected in a direction that can clearly cut off the path of induced eddy current flow, and a single probe is generally used for detection, which restricts the detection efficiency of the eddy current detection system to a certain extent

Method used

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  • Eddy current detecting device used for performing metal defect detection and eddy current probe thereof
  • Eddy current detecting device used for performing metal defect detection and eddy current probe thereof
  • Eddy current detecting device used for performing metal defect detection and eddy current probe thereof

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Embodiment Construction

[0029] The structure of a vortex detection device of the present invention is like Figure 7 It shows that it includes the controller, the circuit of the signal, the filtering the amplifier circuit, the Xiangmin detecting circuit, the signal acquisition card, the upper machine, the first high -speed simulation switch, the second high -speed simulation switch, and the vortex probe of the present invention.Among them, the controller is connected with the signal incidence circuit, filtering circuit, the first high -speed simulation switch, and the second high -speed simulation switch connection.The output terminal is connected to the signal acquisition card, the signal acquisition card is connected to the upper machine, the signal incidence circuit is connected to the first high -speed simulation switch, and the filtering circuit is connected to the second high -speed simulation switch;Connect to the first high -speed simulation switch, each induction coil in the vortex probe is conne...

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Abstract

The invention discloses an eddy current detecting device used for performing metal defect detection and an eddy current probe thereof. The eddy current probe comprises more than one orthogonal combination probe, wherein each orthogonal combination probe comprises one exciting coil and two induction coils, the geometric centers of the two induction coils are overlapped, the central cross sections of the two induction coils pass by the geometric center of the exciting coil, and the central cross sections of the exciting coil and the two induction coils are pairwise vertical. If more than two orthogonal combination probes are arranged, the central cross sections of the exciting coils of all the orthogonal combination probes are located on the same plane, and the geometric centers of all exciting coils are located on the same straight line. The eddy current detecting device comprises a controller, a signal generating circuit, a wave filtering and amplifying circuit, a phase-sensitive wave detecting circuit, a signal collecting card, a host computer, a first high-speed analogue switch, a second high-speed analogue switch and the eddy current probe. According to the eddy current detecting device and the eddy current, the detection sensitivity is high and the detection speed is fast.

Description

Technical field [0001] The invention involves a metal material defect lossless detection sensor structure and corresponding detection circuit. Background technique [0002] The defect detection of metal materials is of great significance in the field of military industry? According to the principle of electromagnetic induction, coils with AC electricity will induces vortex flows in metal materials near its metal material. The induced eddy current will affect the original magnetic field distribution around the detection coil.As a result, the measurement impedance of the inductive coil is changed? The eddy current carries the thickness, defects, conductivity and other information of the metal material. By measured the changes in coil impedance caused by the vortex, the relevant physical parameters of the metal material can be inferred, such as whether there are defects. [0003] In conventional vortex detection, the inductive coil has an original inductive voltage signal output dur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/90G01N27/904
Inventor 陈佩华黄平捷李国厚周泽魁
Owner ZHEJIANG UNIV
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