Glass defect detection method based on transmission-type structured light illumination

Abstract

The invention provides a glass defect detection method based on transmission-type structured light illumination. The glass defect detection method based on projection-type structure illumination has advantages of simple configuration and convenient detection.Therefore, tedious illuminating verification experiments in a traditional scheme can be avoided.A glass sample to be detected forms an imagethrough an array camera, the glass sample to be detected in the obtained image is modulated by a structured light source,so a fringe modulation degree distribution map and a phase distribution map areacquired. Through the fringe modulation degree distribution map and the phase distribution map, defects of internal and external parts of various types of glass are reduced, so array detection is achieved and defect detection efficiency is improved.

Description

technical field [0001] The invention relates to a glass defect detection method, in particular to a glass defect detection method based on transmission structured light illumination. Background technique [0002] In the process of glass production and assembly, defects such as bubbles, stones, distortion, cracks and scratches will occur inside and outside the glass, and these defects will affect the function and aesthetics of glass products. Among them, for large-sized glass defects, the combination of high-brightness line light source and line array camera can be used to realize the lighting structure of bright field and dark field, which can significantly enhance the defect features in the image, thus achieving a good detection effect. [0003] However, this method has the following defects: 1) It needs to adjust the parameters such as the lighting angle and the size of the light source according to the characteristics of the defect. In actual use, a large number of verifi...

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Problems solved by technology

[0003] However, this method has the following defects: 1) It needs to adjust the parameters such as the lighting angle and the size of the light source according to the characteristics of the defect. In actual use, a large number of verification tests are required to confirm the optimal working state, which is cumbersome; 2) For the small-sized flaws inside the glass, due to the weak intensity of scattered light, this detection method combined with bright field and dark field still cannot obtain high-contrast flaw images, which requires extremely high requirements for the back-end flaw detection algorithm. ;3) It needs to be used with a line array camera and a linear module, and cannot achieve area array detection

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