Dual-channel dual-wavelength phase microscopy imaging system and method under non-orthogonal basis

A phase microscopy and imaging system technology, applied in microscopes, instruments, optics, etc., can solve problems such as interference caused by information extraction, and achieve the effects of improving spatiotemporal stability, avoiding incoherent superposition, and suppressing noise.

Active Publication Date: 2021-07-20
JIANGSU UNIV
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Problems solved by technology

In this method, the interference fringes collected by the CCD are the superposition of interference fringes of two different frequencies corresponding to two wavelengths, which will cause interference to information extraction.

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  • Dual-channel dual-wavelength phase microscopy imaging system and method under non-orthogonal basis

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Embodiment approach

[0033]figure 1 It is an embodiment of the dual-channel dual-wavelength phase microscopic imaging system under the non-orthogonal base of the present invention, and the dual-channel dual-wavelength phase microscopic imaging system under the non-orthogonal base includes a light source 1, a 2f mirror 2, Dichroic aperture diaphragm 3, beam expander collimating mirror 4, sample platform 5, objective lens 6, first channel, second channel and computer; said light source 1, 2f mirror 2, dichroic aperture diaphragm 3, beam expanding collimating mirror 4. The sample platform 5 and the objective lens 6 are placed in sequence, and the centers are all on the same optical axis;

[0034] The first channel and the second channel are placed side by side, and the first channel includes the first aperture 7, the first collimator mirror 8, the first grating 9 and the first 4f system, the first aperture 7, the first collimator The centers of the straight mirror 8 and the first grating 9 are all on...

Embodiment 2

[0046] An imaging method of a dual-channel dual-wavelength phase microscopic imaging system under a non-orthogonal base according to embodiment 1, comprising the following steps:

[0047] White light sorting: the beam emitted by the light source 1 passes through the 2f mirror 2, the dichroic aperture stop 3, and the beam expander and collimator mirror 4 to form two non-orthogonal parallel beams;

[0048] Non-orthogonal parallel light sampling: Two non-orthogonal parallel light beams irradiate the sample on the sample platform 5, and the two beams carry the image field information of the sample through the objective lens 6 and enter the first channel and the second channel respectively;

[0049] Dual-wavelength diffraction spectral modulation and imaging acquisition: the light beam entering the first channel passes through the first aperture 7 and the first collimating mirror 8 in turn, after beam expansion and collimation, it is converted into a parallel beam again, and then pa...

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Abstract

The invention provides a dual-channel dual-wavelength phase microscopic imaging system and method under a non-orthogonal basis, including a light source, a 2f mirror, a beam splitting aperture diaphragm, a beam expander collimating mirror, a sample platform, an objective lens, a first channel, a second Two channels and computer; the first channel and the second channel are placed side by side; the first channel includes the first diaphragm, the first collimating mirror, the first grating, the first Fourier lens, the first spatial light modulator, the second Fourier lens and the first CCD camera; the structure of the second channel is the same as that of the first channel; the light beam emitted by the light source is divided into two non-orthogonal parallel beams after passing through the 2f mirror, the beam splitter aperture diaphragm, and the beam expander collimator in turn , and then pass through the sample platform and objective lens in turn, and enter the first channel and the second channel respectively to obtain the interference fringe pattern, which is transmitted to the computer for pattern processing to obtain the three-dimensional shape of the sample. The present invention can perform one-time synchronous phase microscopic imaging of dual-wavelength and dual-path light, obtain the spatial phase distribution of the phase body according to the interference micrograph, and use the reconstruction algorithm to obtain the three-dimensional shape of the sample, and is especially suitable for biological cells Morphological Transient Microscopy.

Description

technical field [0001] The invention belongs to the technical field of phase microscopic imaging, and in particular relates to a dual-channel dual-wavelength phase microscopic imaging system and method under a non-orthogonal basis. Background technique [0002] Light microscopy is a vital tool in the fields of biology and medicine because most cells and tissues are "transparent" under the microscope and have traditionally been made "visible" by staining them. A series of technological innovations in recent years have broken through the past limitations of phase microscopy, which has led to the emergence of quantitative imaging microscopy (QPI). QPI operates on unlabeled samples, thus, it is a complement to established fluorescence microscopy with low phototoxicity and no photobleaching. Since the image represents a quantitative map of the optical path length delay introduced by the sample, QPI provides an objective measure of morphology and kinetics independent of contrast ...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G02B21/36G02B21/00
CPCG02B21/0004G02B21/361G02B21/365
Inventor王亚伟陈璐徐媛媛沈启宝韩豪
OwnerJIANGSU UNIV