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Method for improving scanning test phase precision of vector network analyzer

A technology of vector network analysis and scan test, which is applied in the field of improving the phase accuracy of vector network analyzer scan test, can solve the problems of large phase measurement error and long signal passing time, and achieve inaccurate phase results and simple data processing method Effect

Active Publication Date: 2019-12-06
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

When the DUT is relatively long, the signal passing time is relatively long, which will generate a relatively large phase measurement error

Method used

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  • Method for improving scanning test phase precision of vector network analyzer
  • Method for improving scanning test phase precision of vector network analyzer
  • Method for improving scanning test phase precision of vector network analyzer

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Embodiment Construction

[0035] The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing and specific embodiment:

[0036] A method for improving the phase accuracy of a vector network analyzer scanning test. During the scanning measurement process, the frequency measurement of the intermediate frequency signal is carried out at the same time as the S21 phase measurement, and the time delay of the tested part is calculated through the frequency deviation. The measured initial measurement of the S21 phase is corrected. Specifically include the following steps:

[0037] Step 1: Find the frequency of the response intermediate frequency signal: During the scan test, perform fft transformation on the digitized response intermediate frequency signal, search for the maximum value of the transformed data, and the corresponding frequency is the frequency ω of the response intermediate frequency signal IFa ;

[0038] Step 2: According to the fre...

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Abstract

The invention discloses a method for improving scanning test phase precision of a vector network analyzer, and particularly relates to the technical field of scanning measurement of the vector networkanalyzer. In the scanning measurement process, intermediate frequency signal frequency measurement is carried out while S21 phase measurement is carried out, delay of a measured piece is calculated through frequency deviation, and the measured S21 phase initial measurement value is corrected through the delay of the measured piece. According to the method, factors influencing the phase measurement result can be obtained and the influence thereof is eliminated, and the problem that the phase result error is large when S21 measurement is carried out on a long measured piece through an existingmeasurement method is solved.

Description

technical field [0001] The invention relates to the technical field of vector network analyzer scanning measurement, in particular to a method for improving the phase accuracy of vector network analyzer scanning test. Background technique [0002] A vector network analyzer is a microwave measuring instrument. It generates a microwave signal through a microwave signal source and divides it into two channels. One is used as a reference signal, and the other is used as an excitation signal. The excitation signal excites the DUT to generate a response signal. Both the reference signal and the response signal are mixed with the local oscillator signal generated by the local oscillator source through the mixer, and the frequency is reduced to an intermediate frequency signal with a lower frequency. After sampling and digital processing, the measurement results of the reference circuit R and the response circuit are obtained. Measurement result B. Calculate the ratio of B and R to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/00G01S7/48G01R31/00
CPCG01R31/00G01S7/48G01S17/00
Inventor 许春卿梁胜利杨保国曹志英张庆龙陈恩刚杨玉斌刘丹孙胜凯刘涛邢宇辰
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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