Testability index distribution method and device based on improved analytic hierarchy process

A technique of analytic hierarchy process and index allocation, which is applied to instruments, character and pattern recognition, data processing applications, etc., and can solve problems such as unreasonable synthetic results and insufficient synthetic formulas

Pending Publication Date: 2020-08-11
NO 709 RES INST OF CHINA SHIPBUILDING IND CORP
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Problems solved by technology

However, the synthetic formula of the D-S theory has deficiencies, especially when there are conflicts between the evidences, the synthetic results may be counterintuitive

Method used

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  • Testability index distribution method and device based on improved analytic hierarchy process
  • Testability index distribution method and device based on improved analytic hierarchy process
  • Testability index distribution method and device based on improved analytic hierarchy process

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Embodiment Construction

[0074] The present invention proposes a testing index allocation method and device based on the improved AHP and evidence synthesis theory, improves the AHP, constructs an indirect judgment matrix on the basis of the judgment matrix, and then transforms the judgment matrix into a consistent The property matrix avoids the consistency check and simplifies the operation; adopts a more effective synthesis formula and uses the D-S evidence theory to integrate the evaluations of different experts, which improves the reliability and rationality of the synthesis results.

[0075] In order to make the purpose, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the following The described embodiments are only some, not all, embodiments of the p...

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Abstract

The invention discloses a testability index distribution method and a testability index distribution device based on an improved analytic hierarchy process. The testability index distribution method comprises the steps of: determining an evaluation index system and a hierarchical structure model of testability index distribution; determining a judgment matrix through expert scoring, solving a weight vector of each expert by using an improved AHP method, synthesizing weight values of multiple experts by using an optimized evidence synthesis formula, and respectively calculating to obtain a weight of a standard layer to a decision-making layer and a weight of an object layer to the standard layer; calculating a total hierarchical sorting result; and completing testability index distributionby using a weighting coefficient method. According to the testability index distribution method, an analytic hierarchy process is improved, consistency verification is avoided, and operation is simplified; and a more effective evidence synthesis formula is adopted, so that the reliability and reasonability of a synthesis result are improved.

Description

technical field [0001] The invention belongs to the field of quality management and quality assurance, and in particular relates to a testing index distribution method and device based on improved analytic hierarchy process and evidence synthesis theory. Background technique [0002] Testability allocation is to start from the perspective of the system or the whole machine, according to the testability index requirements stipulated in the development task book, according to certain principles and analysis methods, reasonably allocate to each subsystem or component unit, and then assign its testability index The process of assigning to the constituent units of the underlying system is aimed at enabling designers at all levels of the system to clarify their testability design requirements, estimate the required manpower, resources and time according to the requirements, and study the possibility and design scheme of realizing this requirement. [0003] At present, the commonly...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06K9/62G06F7/78
CPCG06Q10/06395G06Q10/06393G06F7/78G06F18/257G06F18/25
Inventor 许芳
Owner NO 709 RES INST OF CHINA SHIPBUILDING IND CORP
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