Circuit and method for realizing aging experiment of three-phase inverter power module

Abstract

The invention relates to a circuit and a method for realizing an aging experiment of a three-phase inverter power module. The circuit includes: a three-phase AC input side voltage sensor; a three-phase AC input side current sensor; a three-phase AC input side pre-charging contactor, a three-phase AC input side line contactor, a three-phase voltage regulator, an AC side reactor, a DC contactor, a DC pre-charging resistor, a DC discharging resistor, a discharging contactor, a DC side voltage sensor, a DC side current sensor, a plurality of accompanying transformers and a plurality of accompanying modules. Any alternating current side voltage characteristic can be realized by controlling the DUT, the amplitude and the power factor of the DUT alternating current are controlled by the test accompanying module, any DUT alternating current side fundamental current characteristic can be simulated, and corresponding actual alternating current side equipment does not need to be used, so that theaging test process is simple, and the general adaptability is good.

Description

technical field [0001] The invention relates to a circuit and a method for realizing an aging experiment of a three-phase inverter power module under the actual load working condition. Background technique [0002] The three-phase inverter power module is composed of heat sink and thermal grease, power busbar, power switching device and its driving components, DC side support capacitor, voltage and current sensor and other components. As far as the aging experiment of the power switching device of the three-phase inverter power module is concerned, the main problem is that on the one hand, it is impossible to realize the aging experiment of the power device under the actual topology or the physical composition of the three-phase inverter power module; On the one hand, aging experiments under actual load or actual working conditions cannot be realized. Therefore, in the current aging experiments of power devices, the aging experiment results for individual power switching de...

AI Technical Summary

Problems solved by technology

As far as the aging experiment of the power switching device of the three-phase inverter power module is concerned, the main problem is that on the one hand, it is impossible to realize the aging experiment of the power device under the actual topology or the physical composition of the three-phase inverter power module; On the one hand, it is impossible to achieve aging experiments under actual load or actual working conditions

Therefore, in the current aging experiments of power devices, the aging experiment results for individual power switching devices (IGBT modules are the most common) are difficult to apply to the actual topology, the physical composition of the actual three-phase inverter power module, or the actual load. The service life evaluation or service life prediction of the IGBT module under working conditions, so the service life of the IGBT module under the current actual topology, the actual three-phase inverter power module physical composition or the actual load condition is difficult to pass the existing Accurate prediction or evaluation of aging test results

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