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Curvature obtaining method, curvature testing equipment and curvature adjusting device

A technology for adjusting device and curvature, which can be used in measurement devices, instruments, scanning probe microscopy, etc.

Pending Publication Date: 2020-11-17
SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The existing method to study the microstructure and properties of flexible films under different bending radii is to fix the flexible films on cylinders with different bending radii, and then use atomic force microscope (Atomic Force Microscope, AFM) to analyze their microstructure and properties. Test, it can be seen that the existing methods are difficult to achieve in-situ testing and adjustable bending

Method used

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  • Curvature obtaining method, curvature testing equipment and curvature adjusting device
  • Curvature obtaining method, curvature testing equipment and curvature adjusting device
  • Curvature obtaining method, curvature testing equipment and curvature adjusting device

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Embodiment Construction

[0030] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the specific embodiments set forth herein. Rather, the embodiments are provided to explain the principles of the invention and its practical application, thereby enabling others skilled in the art to understand the invention for various embodiments and with various modifications as are suited to particular intended uses. In the drawings, the same reference numerals will be used to denote the same elements throughout.

[0031] The bending adjustment device provided by this application is used to adjust the bending degree of the flexible film. The bending adjustment device includes a bottom plate, a carrier, a lifting mechanism, a first pressing plate and a second pressing plate, and the carrier and the lifting mechanism are fixedly connected to ...

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Abstract

The invention provides a curvature obtaining method, curvature testing equipment and a curvature adjusting device, the curvature adjusting device comprises a bottom plate, a carrying table, a liftingmechanism, a first pressing plate and a second pressing plate, the carrying table and the lifting mechanism are both fixedly connected with the bottom plate, and the first pressing plate and the second pressing plate are both fixedly connected with the lifting mechanism. The carrying table is located between the first pressing plate and the second pressing plate, the flexible thin film is clampedbetween the carrying table and the first pressing plate and the second pressing plate, and the lifting mechanism drives the first pressing plate and the second pressing plate to move towards the bottom plate and press the two ends of the flexible thin film downwards so as to adjust the bending degree of the flexible thin film. According to the curvature adjusting device, the first pressing plate and the second pressing plate are driven by the lifting mechanism to move towards the bottom plate and press the two ends of the flexible thin film downwards, and the curvature of the flexible thin film is adjusted by adjusting the pressing degree of the two ends of the flexible thin film; and the microstructure and performance of the flexible film under different bending radiuses are obtained through a detector, so that in-situ test and adjustable curvature are realized.

Description

technical field [0001] The invention relates to the technical field of flexible film performance testing, in particular to a curvature acquisition method, curvature testing equipment, and curvature adjustment device. Background technique [0002] Flexible films are currently mainly used in flexible devices and wearable devices. Due to their bendable properties, more and more people pay attention to them, and they are widely used in more and more fields. After the flexible film is bent, its surface charges, electric domains, and magnetic domains will change. It can be seen that the performance after bending is very important for the selection and application of flexible films. Therefore, it is necessary to study the microstructure and properties of flexible films under different bending radii. Performance is of great value for its practical application. [0003] The existing method for studying the microstructure and properties of flexible films under different bending radii...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24G01Q30/20G01B21/20
CPCG01Q60/24G01Q30/20G01B21/20
Inventor 李江宇唐铭锴刘正浩欧云
Owner SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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