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Method and device for measuring stray radiation in large-aperture infrared photoelectric system

A technology of stray radiation and measurement method, which is applied in the field of measurement of stray radiation in large-diameter infrared photoelectric systems, can solve the problem that large-diameter infrared photoelectric systems cannot measure stray radiation in temperature-controlled boxes, and achieves easy implementation, measurement and calculation. Simple process effect

Active Publication Date: 2021-07-09
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The main purpose of the present invention is to provide a method and device for measuring stray radiation in a large-diameter infrared photoelectric system, so as to solve the problem that the large-diameter infrared photoelectric system cannot measure stray radiation in a temperature control box in the prior art

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  • Method and device for measuring stray radiation in large-aperture infrared photoelectric system

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[0036] The technical problems solved by the embodiments of the present invention, the technical solutions adopted and the technical effects achieved are clearly and completely described below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present application, not all of them. Based on the embodiments in the present application, all other equivalent or obviously modified embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention. Embodiments of the invention can be embodied in many different ways as defined and covered by the claims.

[0037] It should be noted that, in the following description, many specific details are given for the convenience of understanding. It may be evident, however, that the present invention may be practiced without these specific details.

[0038] It should be noted that, in...

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Abstract

The invention provides a method and device for measuring stray radiation in a large-aperture infrared photoelectric system, and the method comprises the steps: adjusting the position of a to-be-measured infrared photoelectric system to be aligned with the position of a black body, and then changing the temperature of the black body, so as to carry out the radiometric calibration of the to-be-measured infrared photoelectric system, and obtaining a response gain G0, and response offsets hdet1 and hdet2; acquiring the current environment temperature Tamb0, increasing the temperature of the black body to T1, and acquiring an image h(t0, T1 and Tamb0) at the integral time t0; continuously raising the temperature of the black body to T2, and acquiring an image h (t, T2, Tamb0) at the integral time t (t is not equal to t0); calculating the stray radiation response coefficient Gstack according to a formula, and measuring the internal stray radiation of the infrared photoelectric system at different temperatures. A low-temperature experiment box is not needed in the process, and the measurement and calculation process is simple and easy to implement.

Description

technical field [0001] The invention relates to the technical field of photoelectric radiation measurement, in particular to a method and device for measuring stray radiation in a large-aperture infrared photoelectric system. Background technique [0002] The ground-based infrared imaging system is an important part of the optical observation equipment of the shooting range. With the rapid development of infrared technology, measurement and control technology and equipment technology, the ground-based infrared imaging system of the shooting range has also been widely used in the measurement of infrared radiation characteristics of military targets in the shooting range. Radiation characteristic measurement is actually a kind of quantitative remote sensing technology. Quantification means that the system needs to be calibrated. Radiation calibration technology based on standard reference radiation sources is the basis of high-precision infrared radiation characteristic measure...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G01J5/00
CPCG01M11/02G01J5/00
Inventor 李周何锋赟余毅
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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