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Detector for electromagnetic radiation and manufacturing method therefor

A technology for electromagnetic radiation and detectors, which is used in radiation measurement, semiconductor/solid-state device manufacturing, X/γ/cosmic radiation measurement, etc., and can solve problems such as adhesion difficulties

Pending Publication Date: 2021-08-06
SIEMENS HEALTHCARE GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The multilayer construction of the corresponding detectors also creates difficulties for the adhesion between the individual layers and can also cause other problems, such as when adapting the crystal structure to the preceding layer, for example.

Method used

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  • Detector for electromagnetic radiation and manufacturing method therefor
  • Detector for electromagnetic radiation and manufacturing method therefor
  • Detector for electromagnetic radiation and manufacturing method therefor

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Embodiment Construction

[0058] Unless defined otherwise, technical and scientific expressions used herein have the same meaning as commonly understood by one of ordinary skill in the field of expertise of the present invention.

[0059] Quantitative statements within the scope of the present invention relate to % by weight unless stated otherwise or evident from the context.

[0060] A first aspect of the invention relates to a detector for electromagnetic radiation, in particular an X-ray detector and / or a gamma-ray detector, comprising:

[0061] - a first electrode layer comprising at least one first electrode pixel and a second electrode pixel and an intermediate space between said first electrode pixel and said second electrode pixel,

[0062] - the second electrode,

[0063] - a first layer comprising at least one first perovskite, said first layer being located between a first electrode pixel of said first electrode layer and said second electrode, and

[0064] - a second layer comprising at ...

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Abstract

The invention relates to a detector for electromagnetic radiation, comprising a first electrode layer comprising at least one first electrode pixel and a second electrode pixel; a second electrode; and a first layer comprising at least one first perovskite, the first layer being located between the first electrode pixel and the second electrode of the first electrode layer; and a second layer comprising at least one second perovskite different from the first perovskite, the second layer being located between the second electrode pixels of the first electrode layer and the second electrode. The detector for electromagnetic radiation, comprises the first electrode layer comprising at least one first electrode pixel and a second electrode pixel; the second electrode; and the first layer comprising at least one first perovskite, the first layer being located between the first electrode pixels of the first electrode layer and the second electrode, and between the second electrode pixels of the first electrode layer and the second electrode. The invention also relates to a method for manufacturing the detector.

Description

technical field [0001] The invention relates to a detector for electromagnetic radiation, said detector comprising: a first electrode layer comprising at least one first electrode pixel and a second electrode pixel; a second electrode; and a first layer, the first layer comprising at least one first perovskite, the first layer being located between the first electrode pixel of the first electrode layer and the second electrode; and a second layer, the The second layer comprises at least one second perovskite different from the first perovskite, the second layer is located between the second electrode pixel of the first electrode layer and the second electrode, the present The invention relates to a detector for electromagnetic radiation, said detector comprising: a first electrode layer comprising at least one first electrode pixel and a second electrode pixel; a second electrode; and a first layer , the first layer comprises at least one first perovskite, the first layer is ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/32H01L51/52H01L51/56
CPCH10K59/123H10K59/122H10K50/805H10K71/00H01L27/1463H01L27/14632H01L27/14687H01L27/14663H10K85/50G01T1/20185H01L27/14683
Inventor 萨拉·多伊梅尔桑德罗·弗朗切斯科·泰德朱迪斯·伊丽莎白·许尔德勒
Owner SIEMENS HEALTHCARE GMBH