Detection system
An inspection system and technology to be inspected, applied in the field of inspection systems, can solve problems such as inability to detect internal defects in optical components above the height information of components on the board
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[0042] In order to enable those skilled in the art to better understand the technical solution of the present application, the detection system provided by the present application will be further described in detail below in conjunction with the drawings and specific embodiments. It should be understood that the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0043] The terms "first", "second", etc. in this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps ...
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