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Impact sample notch projector

A technology for impacting samples and projectors, which is applied in the direction of testing the strength of materials, instruments, and scientific instruments using a single impact force. , Avoid looking for the effect of lamps

Pending Publication Date: 2022-05-13
江苏南测质量检测有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The existing impact sample notch projector technology has the following problems: when the existing impact sample notch projector is in use, due to the short life of the internal lamps, it needs to be replaced after a period of use, and most of them need to be replaced for a long time. Time spent looking for lamps, which can lead to inconvenient use of the device

Method used

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  • Impact sample notch projector
  • Impact sample notch projector
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Embodiment Construction

[0017] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0018] In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front end", "rear end", "both ends", "one end", "another end" The orientation or positional relationship indicated by etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that ...

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PUM

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Abstract

The invention discloses an impact sample notch projector which comprises a base and a supporting frame, the supporting frame is arranged at the upper end of the base, the base and the supporting frame are fixed in a spot welding mode, a case is arranged at the upper end of the supporting frame, a storage box is arranged on the left side of the upper end of the supporting frame, and a screen is arranged on the right end surface side of the case. The storage box is arranged on one side of the supporting frame, meanwhile, the protective pad is arranged on the periphery of the interior of the storage box, the protective pad has certain elasticity, when a lamp is placed in the storage box, the lamp can be better protected through the protective pad, the phenomenon that the lamp is damaged due to shaking is avoided, and the service life of the lamp is prolonged. And a lamp needing to be replaced can be placed in the storage box, if the lamp in the case is damaged, a standby lamp can be easily replaced, the step of finding the lamp for a long time is avoided, and therefore the device can be conveniently used.

Description

technical field [0001] The invention belongs to the technical field related to impact sample notch projectors, in particular to an impact sample notch projector. Background technique [0002] The impact test has strict requirements on the notch of the impact sample, and small changes in the notch will cause errors in the test results. In order to ensure that the notch of the processed impact sample is qualified, the processing quality inspection of the notch is an important control method. [0003] The existing impact sample notch projector technology has the following problems: when the existing impact sample notch projector is in use, due to the short life of the internal lamps, it needs to be replaced after a period of use, and most of them need to be replaced for a long time. Time spent looking for lamps, which can lead to inconvenient problems with using the device. Contents of the invention [0004] The object of the present invention is to provide a notch projector...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/06G01N3/02G01N3/30
CPCG01N3/068G01N3/02G01N3/30
Inventor 郭红娟
Owner 江苏南测质量检测有限公司