Efficient measurement method, auxiliary measurement substrate, computer equipment and storage medium

A technology of auxiliary measurement and measurement method, which is applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of low measurement efficiency of the workpiece to be measured and reduce the service life of the secondary element measuring instrument, so as to reduce the number of mobile positioning and improve the use of Effects of life and measurement time reduction

Pending Publication Date: 2022-07-29
广东小镓技术有限公司
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0002] The two-dimensional measuring equipment on the market generally manually places the workpiece to be measured on the workbench, and then the two-dimensional measuring instrument performs automatic positioning and grabbing of the workpiece to be measured on the workbench to measure the size of the workpiece to be measured. For the measurement of circuit boards, due to the multi-functional development of electronic products, a large number of functional modules are arranged in the effective electronic product space, making the circuit boards move towards lighter, thinner and smaller directions, so the specifications of the circuit boards after molding Dimensional accuracy requirements are becoming more stringent, and in order to monitor the specifications and sizes of circuit boards, the prevailing measurement method at this stage is to use a two-dimensional measuring instrument to measure one by one. The workpiece needs to be moved and positioned, and then grab and measure the workpiece to be measured in each different placement position for size measurement. In order to increase the measurement efficiency of the workpiece to be measured, the secondary element measuring instrument will be used for uninterrupted and long-term size measurement. , which greatly reduces the service life of the secondary element measuring instrument, and despite this, the measurement efficiency of the workpiece to be measured is still low

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  • Efficient measurement method, auxiliary measurement substrate, computer equipment and storage medium
  • Efficient measurement method, auxiliary measurement substrate, computer equipment and storage medium
  • Efficient measurement method, auxiliary measurement substrate, computer equipment and storage medium

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Embodiment Construction

[0037] In order to facilitate understanding of the present invention, the present invention will be described more fully hereinafter with reference to the related drawings. The preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention may be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that a thorough and complete understanding of the present disclosure is provided.

[0038] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for the purpose of illustration only ...

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Abstract

The invention provides an efficient measurement method, an auxiliary measurement substrate, computer equipment and a storage medium. The auxiliary measurement substrate comprises a substrate body and a substrate positioning body. The substrate body is provided with a plurality of placing grooves, the plurality of placing grooves are arranged at intervals, each placing groove is used for placing a workpiece to be measured, a first gap and a second gap are arranged between the groove wall of each placing groove and the workpiece to be measured, the size of the first gap is 0-0.3 mm, and the size of the second gap is 0.3-0.6 mm. The substrate positioning body is arranged on the periphery of the substrate body, the substrate positioning body is connected with the outer edge of the substrate body, at least three positioning holes are formed in the substrate positioning body, each positioning hole is used for optical positioning, and the extending direction of each placing groove is parallel to the extending direction of each positioning hole. The auxiliary measuring substrate can prolong the service life of a measuring instrument, and can improve the measuring efficiency.

Description

technical field [0001] The present invention relates to the technical field of secondary element measurement, in particular to an efficient measurement method, an auxiliary measurement substrate, computer equipment and a storage medium. Background technique [0002] The two-dimensional measuring equipment on the market generally places the workpiece to be measured on the workbench manually, and then the two-dimensional measuring instrument performs automatic positioning and grasping of the workpiece to be measured on the workbench to realize the measurement of the size of the workpiece to be measured. For the measurement of circuit boards, due to the development of multi-functional electronic products, many functional modules are arranged in the effective electronic product space, so that the circuit boards move in the direction of lighter, thinner and smaller. The requirements for dimensional accuracy are becoming more and more stringent, and in order to monitor the specifi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/00
Inventor 黄水权许校彬邵勇樊佳杨柯
Owner 广东小镓技术有限公司
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