Circuit for testing a usb device using a packet to be measured controlled by test signals
一种测试电路、测试信号的技术,应用在电数字数据处理、错误检测/纠正、检测有故障的计算机硬件等方向,能够解决长时间、LSI成本影响较大、工时数和调试需要很多时间等问题,达到时间缩短、削减工时数的效果
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[0034]Hereinafter, embodiments of the USB test circuit of the present invention will be described in detail with reference to the accompanying drawings. For example, as shown in FIG. 1, the USB test circuit 10 of the present invention inputs a signal representing information relevant to the operating mode of the circuit to the serial I / F module 12, and keeps the information in the packet type register 14, loop flag In the register 16 and the number of bytes to send register 18, the data pattern (pattern) generating module 20 and the sending data sending module 22 generate the sending data as the measurement object packet conforming to the information, and in addition, the valid timing generating module 24 generates the sending data Timing when data is valid. In addition, in this circuit 10 , the output interval when the transmission data is repeatedly output is determined by the inter-packet timing generation module 26 . In addition, parts not directly related to the understa...
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