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On-line monitoring method for defects of phase-shift keying signal generated by electro-optic modulator

An electro-optical modulator and phase-shift keying technology, applied in transmission monitoring/testing/fault measurement systems, electrical components, electromagnetic wave transmission systems, etc., can solve problems such as the influence of light source power fluctuations

Inactive Publication Date: 2011-12-28
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0018] The above methods measure the absolute value of optical power, which is easily affected by the fluctuation of light source power. In order to solve this problem, a method with greater dynamic monitoring sensitivity is proposed.

Method used

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  • On-line monitoring method for defects of phase-shift keying signal generated by electro-optic modulator
  • On-line monitoring method for defects of phase-shift keying signal generated by electro-optic modulator
  • On-line monitoring method for defects of phase-shift keying signal generated by electro-optic modulator

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Embodiment Construction

[0046] The present invention will be further described below in conjunction with the drawings and embodiments:

[0047] Image 6 A diagram showing an on-line monitoring system 600 for a defect in an electro-optical modulator to generate a phase shift keying signal according to an embodiment of the present invention. The online monitoring system 600 includes: a laser 610, a first coupler 620, a modulator group 630 (may include one or more modulators, such as an intensity modulator cascade phase modulator), a second coupler 640, and a third coupler 650, a digital-to-analog converter 660, a sampling and analog-to-digital converter 670, a detector 680, and a processor 690.

[0048] Among them, the laser 610 is used to emit laser light. Those skilled in the art should understand that the wavelength of the light source is not limited to the wavelength of the signal light, but can also be other wavelengths, and it is not limited to the direction in which the light from the light source a...

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Abstract

The invention provides a method and a device for monitoring electro-optic modulator generating phase shift keying signal defect. The method includes: partial light before modulation and light after modulation which come from same light source are wave combined; average light power of wave combined light is measured by using low-speed light; maximum value and minimum value of wave combined light average light power is recorded, and ratio of the maximum value to the minimum value is calculated as indicatrix of phase shift keying signal multi-defect. The device and method provided by the invention have no element sensitive to signal unrelated physical quantity; have simple structure and low cost; and can eliminate effect of light source power.

Description

Technical field [0001] The invention relates to a defect monitoring method and a measuring device for a phase shift keying signal generated by an electro-optical modulator, in particular to a defect monitoring method and a device for a high-speed phase shift keying signal used in high-speed and large-capacity optical communications. Background technique [0002] With the continuous surge in demand for information and communication, the requirements for long-distance and large-capacity optical transmission systems are becoming increasingly urgent. The phase shift keying signal has become the preferred signal format in this type of system due to its excellent resistance to noise and other transmission impairments, and it is also the basis for other advanced modulation format signals. At present, various phase shift keying signals are generated using electro-optic phase modulators or Mach-Zehnder intensity modulators. However, due to factors such as device aging and environmental ch...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B10/08H04B10/12H04B10/07
Inventor 闻和姜欢冯勇郑小平张汉一郭奕理周炳琨
Owner TSINGHUA UNIV