Vacuum fluorescent display device life-span prediction method

A technology for life prediction and display, which is used in optical instrument testing, machine/structural component testing, instruments, etc., to save life test time and reduce life prediction costs.

Inactive Publication Date: 2009-01-07
SHANGHAI UNIVERSITY OF ELECTRIC POWER
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Problems solved by technology

[0004] The present invention aims at the lack of a life prediction method for vacuum fluorescent displays based on acceleration parameters in the existing domestic market, and proposes a life prediction method for vacuum fluorescent dis

Method used

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  • Vacuum fluorescent display device life-span prediction method
  • Vacuum fluorescent display device life-span prediction method
  • Vacuum fluorescent display device life-span prediction method

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Embodiment Construction

[0010] Under the condition that the acceleration parameter β of the vacuum fluorescent display (VFD) has been determined, if the average life expectancy is predicted, it is only necessary to make a filament temperature stress of T (700℃≤T≤850℃, it is recommended that the filament temperature is close to the maximum temperature stress) Compared with the conventional VFD life test and accelerated life test, the accelerated life test can be used to predict its average life, which can shorten the test time and save the manpower, material and financial resources required for the test.

[0011] If there are n test sample tubes under a filament acceleration temperature stress T, the acceleration coefficient is:

[0012] τ = exp { β ( 1 T 0 - 1 T ...

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Abstract

The invention relates to a prediction method of the life of vacuum fluorescent display (VFD), which uses the weibull distribution to describe the life of the VFD. The maximum likelihood method is used to estimate the parameters so as to predict the average life span of the VFD under the condition of accelerating temperature stress T; finally the predicted average life span is applied to the formula of average life under the normal stress of the VFD (Mu 0 is equal to Tau square Mu) so as to acquire the average life of the VFD under the normal stress. Thus the prediction method can realize the estimation of the life of the VFD in a short period of time, saves the life testing time, and reduces the life predicting costs.

Description

technical field [0001] The invention relates to a life prediction method, in particular to a vacuum fluorescent display life prediction method. Background technique [0002] Vacuum fluorescent display (VFD) is a highly reliable and long-life electronic product, which is widely used in the display of electronic and electrical equipment. In order to obtain its life distribution and various reliability characteristics, it takes tens of thousands of hours to adopt the basic reliability test method of life test under normal working conditions; at the same time, due to the rapid development of science and technology, the speed of product replacement is getting faster and faster , and the increasingly fierce market competition, the life test must be carried out under normal working conditions, and the product may have been updated at the end of the test, which loses the significance of the test. Therefore, there is an urgent need to conduct accelerated life tests on VFDs in order ...

Claims

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Application Information

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IPC IPC(8): G01M11/00
Inventor 张建平
Owner SHANGHAI UNIVERSITY OF ELECTRIC POWER
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