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Circuit parameter multi-point tester

A circuit parameter and tester technology, which is applied in the field of virtual instruments, can solve the problems that multiple test instruments cannot work at the same time, the test is not flexible, and the test instrument has poor scalability.

Active Publication Date: 2012-07-04
陕西海泰电子有限责任公司
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Problems solved by technology

[0003] The purpose of the present invention is to overcome the shortcomings of poor expansibility of test instruments in circuit parameter testing, multiple test instruments cannot work at the same time, waste of switch quantity brought by only matrix switches and inflexibility of tests brought by only multi-way switches, and provide An open circuit parameter multi-point tester with strong scalability and flexible topology

Method used

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Embodiment Construction

[0016] The composition of circuit parameter multi-point tester of the present invention is as figure 1 and figure 2 As shown, it is composed of a plurality of circuit parameter testing instruments 1, an instrument end matrix switch 4, a circuit end matrix switch 7, a circuit connection switch 52, and an adapter 6. Test instruments are used to test various performance parameters of the circuit under test, including multimeters, signal sources, oscilloscopes, insulation testers, withstand voltage testers, etc. Other parameter testers can also be added according to requirements. The instrument end matrix switch and the circuit end matrix switch are used to gate the test end of the test instrument to different circuit connection switches 52 . The left part is the instrument end matrix switch, which is formed by connecting the analog bus and the instrument test line of the test instrument through the switch; the right part is the circuit end matrix switch, which is formed by conn...

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Abstract

The invention relates to a circuit parameter multi-point tester which comprises at least one circuit parameter multi-point testing apparatus, an analogue bus, a multi-way switch group and a commutator, wherein the multi-way switch group comprises a plurality of multi-way switches; and the commutator is used for connecting the multi-way switches and circuits to be tested. The circuit parameter multi-point tester also comprises an apparatus end matrix switch which is used for gating between an apparatus test wire and the analogue bus; and each multi-way switch comprises an analogue bus connecting switch and a circuit connecting switch, and the analogue bus connecting switch of the multi-way switch group and the analogue bus form a circuit end matrix switch which is used for realizing the switching of a test loop among different circuits to be tested. The invention solves the defects of poor expansibility of the testing apparatus in the circuit parameter test, incapability of simultaneously working of a plurality of testing apparatuses, waste and inflexible test, and has the advantages of strong expansibility and flexible topological structure.

Description

technical field [0001] The invention relates to the technical field of virtual instruments, and relates to a multi-point test instrument for circuit parameters. Background technique [0002] Some of the existing circuit parameter testing instruments use matrix switches, which leads to a waste of the number of switches, and some use multi-way switches, which brings the disadvantage of inflexible testing. In addition, the expansibility of the circuit parameter test instrument is poor, and multiple test instruments cannot work at the same time. Contents of the invention [0003] The purpose of the present invention is to overcome the shortcomings of poor expansibility of test instruments in circuit parameter testing, multiple test instruments cannot work at the same time, waste of switch quantity caused by only matrix switches and inflexibility of tests brought by only multi-way switches, and provide An open circuit parameter multi-point tester with strong scalability and fl...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/02G01R31/12
Inventor 郭恩全高宝平白晓峰张亚峰刘卫东
Owner 陕西海泰电子有限责任公司
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