53results about How to "Simultaneous testing" patented technology

The invention discloses a full-automatic multi-channel cigarette drop tendency detection device and a detection method. The detection device is characterized by comprising a multi-channel rotating disc structure unit, an automatic cigarette sample feeding unit, an automatic cigarette sample ignition and combustion line detection unit, a tested cigarette clamping and stressing unit, an automatic drop detection and taking unit, a smoking fume capturing unit during smoking, a smoking unit and a fume exhaust unit which are arranged in a main body frame, and a circuit and gas path control unit forcontrolling action and process of the units. By adopting the detection device, according to certain steps, cigarette samples sequentially inserted into a rotating disc are automatically ignited, combustion lines are detected, controllable external force is applied to the combusting cigarette samples, and cigarette drop tendency of the cigarette products is detected according to the phenomena of drops of multiple cigarette samples. By adopting the detection device, the testing repeatability and the working efficiency can be improved.

The invention belongs to the focal length adjustment technical field and relates to an automatic focusing method of a scanning code device. The method includes the following steps that: the running speed value of a conveyor belt is preset, and the focal length of the lens of the scanning code device is adjusted to be a default focal length; images are acquired according to a fixed time interval, measured objects on the conveyor belt in the images are judged, and the characteristic position of each measured object is calibrated; the deviation pixel values of the measured objects are obtained according to the deviation of the characteristic positions of the measured objects in the fixed time interval; vertical distances between the measured objects and the lens are calculated; and the focallength of the lens is automatically adjusted according to the vertical distances between the measured objects and the lens. The present invention also provides an automatic focusing system corresponding to the automatic focusing method. According to the automatic focusing method of the invention, a distance measuring device such as a distance sensor is not required to be additionally adopted, thedistances between the measured objects and the scanning lens can be quickly determined, and the focal length of the lens can be quickly adjusted.

The invention provides a clutch driven plate torsion durability testing device. The clutch driven plate torsion durability testing device comprises an actuator, a rocker bar and a linkage mechanism. The actuator is movably connected with the rocker bar; the linkage mechanism comprises an input shaft, a coupling sleeve and a driven plate hub, wherein the coupling sleeve is fixedly connected with the rocker bar and the input shaft; the rocker bar moves linearly to drive the coupling sleeve and the input shaft to rotate; one end of the input shaft is connected with the driven plate hub. The clutch driven plate torsion durability testing device has the advantages of being capable of adjusting torsion angle and loaded torque by controlling travel of the actuator, monitoring the torsion angle and the loaded torque in real time through an angle and torque sensor, and meanwhile, achieving simultaneous testing of multiple samples.

The invention relates to a method and apparatus for testing a transmitter chip. The method comprises the steps: receiving a signal of a chip to be tested according to the transmitted test rate of a test firmware; sending the signal under the test rate to a digital signal processing chip so as to enable the digital signal processing chip to calculate and analyze the signal under the test rate to obtain the test result; and sending the test result to a testing machine. The method and apparatus for testing a transmitter chip utilize the chip to transmit and receive the signal of a chip to be tested and to analyze the signal so as to replace an instrument in a traditional calibration and testing mode, and can realize automatic calibration and testing through the firmware.

The invention discloses an optical communication device automatic adjusting device, a method, equipment and a storage medium. Through the debugging and calibration process of the optical module, an optical module testing process and an optical device testing process are redesigned. The optical communication device products are packaged in the host computer, including debugging, calibration, testing and other functions. The optical communication device products are packaged into different functional test functions according to the different test functions. Thus, the debugging and calibration ofthe optical module and the testing of the optical device are carried out together, the utilization rate of the instrument and equipment is effectively improved, and the production efficiency is greatly improved.

The invention discloses a neutron diffraction method for welding residual stress of a duplex stainless steel thick plate. The method comprises the following steps: determining stress testing crystal faces in different directions and a wavelength changing manner, so that a penetration depth of the neutron in the duplex stainless steel thick plate is increased, and testing time and testing errors are reduced; accurately calculating a two-phase ratio in a standard volume of the neutron diffraction test by virtue of transformation of diffraction peak intensity; and simultaneously testing two-phasestresses under specific equipment and diffraction conditions. According to the method disclosed by the invention, the penetration depth of the neutron can be effectively improved by virtue of a variable wavelength manner; the residual stress time of the duplex stainless steel thick plate in the neutron diffraction test can be reduced; the testing error of the residual stress of the duplex stainless steel thick plate can be reduced; the two-phase ratio in the standard volume can be accurately calculated by utilizing data of the diffraction peak intensity obtained by the neutron diffraction; and the influence produced by micro stress caused by two-phase performance mismatching is clear, and macro welding residual stress distribution of the duplex stainless steel is accurately calculated.

A test device of CD drive in/out tray consists of selection unit for selecting out one set of multiple optical drive to carry out test and for setting selected CD drive as current optical drive, command sending unit for sending in/out tray command to current CD drive for driving CD drive to be in/out tray, detection unit for detecting whether in/out tray of CD drive is finished or not, timing unit for recording total in/out tray time from receiving command to action finishing, control unit for controlling said selection unit to select next CD drive to be tested according to preset sequence.

The invention discloses a portable multi-contact relay checking instrument and a checking method thereof. The checking instrument is composed of a controller, a DC-DC voltage regulation module, a contact test module, a signal synchronization module, a test function switching switch and a man-machine interaction module. The man-machine interaction module is connected with the controller. The DC-DC voltage regulation module is connected with the controller and is controlled by the controller to adjust a voltage needed for output; the DC-DC voltage regulation module is provided with a positive output terminal and a negative output terminal that are used for connecting two ends of a relay coil. The contact test module has at least one pair of interfaces for connecting auxiliary contacts of the relay. The DC-DC voltage regulation module and the contact test module are connected to the controller through connection with the signal synchronization module. The signal synchronization module is used for realizing synchronous collection of the deflection voltage and time of the auxiliary contact of the contactor. The test function switching switch is connected with the controller and is used for sending a switching signal to the controller, thereby starting a corresponding testing function procedure of the controller. The portable multi-contact relay checking instrument has advantages of high portability, improved checking efficiency, and complete functions.

The invention discloses a radio frequency (RF) probe for testing PCB board impedance. The RF probe comprises ground pins, a ground shell, a ground spring, a signal pin, and a flange; two ground pins and one signal pin are arranged; since the flange covers a main outer conductor shell in the testing process, three contact pins without eccentricity is guaranteed when the flange is pressed; three contact pins perfectly contact a testing point of a PCB board, the contact is good and non-eccentric; the RF probe joint type is a SMA female structure and adopts a standard structure; the RF probe is mature and stable, high in frequency and simple in processing; the probe use frequency is greater than the actual use frequency of the PCB board, the working frequency can completely adapt to the testing width required by the PCB board.

The present invention relates to a calibration method and device for a transmitter chip. The method comprises the steps that a chip to be tested transmits a sinusoidal signal to a standard chip such that the standard chip can transmit the sinusoidal signal to a digital signal processing chip for analysis; the chip to be tested adjusts a DC bias parameter and an I/Q channel bias mode parameter according to the testing result sent by a testing machine platform, wherein the testing result sent by the testing machine platform is obtained by analyzing the sinusoidal signal by the digital signal processing chip. According to the calibration method and device for a transmitter chip provided by the invention, the chip can be used to transmit and receive the signal of the chip to be tested and carry out analyzing, the instrument in a conventional calibration and test mode is replaced, and the automation of calibration and test is realized through a firmware.

The invention discloses a heterostructure structural color microfiber, a preparation method thereof and a myocardial cell detection method. The preparation method comprises the following steps that: amicro-fluidic chip is constructed for a heterostructure structural color microfiber preparation platform by adopting a capillary tube, and pre-polymerization solutions are prepared as fiber components, wherein each pre-polymerization solution comprises a biocompatible hydrogel solution and silicon dioxide non-close packing colloidal crystal pre-gel with at least one concentration, and a photoinitiator is added into each pre-polymerization solution; and the two types of pre-polymerization solutions are alternately injected into a collecting pipe in a programmed mode through the micro-fluidic chip, and the collecting pipe part is continuously irradiated through ultraviolet light to obtain the heterostructure structural color microfiber. The heterostructure structural color microfiber has the advantages of controllable preparation, low cost, capability of realizing cell physiology visual quantitative sensing and the like.

The invention discloses a test method and system of multiple paths of E1 ports for realizing an STM-1 interface. The method comprises the following steps of: building one-to-one correspondence relationship between each E1 port on the STM-1 interface at the middle equipment circuit side and N paths of E1 ports at the middle equipment branch circuit side; sequentially connecting N paths of E1 ports at the middle equipment branch circuit side in series, forming a serial connection test passage of N paths of E1 ports, connecting an SDH (Synchronous Digital Hierarchy) test instrument, and carrying out butt joint between the STM-1 interface at the middle equipment circuit side with the STM-1 interface of the tested equipment; and simultaneously testing all the E1 ports of the STM-1 interface of the tested equipment by the SDH test instrument through the serial connection test passage of the N paths of E1 ports, wherein N is an integer greater than or equal to 2. The middle equipment is used for completing the serial connection of multiple paths of E1 ports and the mapping of the E1 ports to the STM-1 interface, the monitoring of each path of E1 port of multiple paths of E1 ports on the STM-1 interface through network management is completed, and the simultaneous test of multiple paths of E1 ports on the STM-1 interface is realized.

The invention discloses a running-in testing machine for a linear guide rail pair, which comprises a machine frame, guide rail mounting plates are respectively arranged on the left and right sides ofthe top of the rack; a base and a movable support are arranged in the middle of the top of the rack. An auxiliary guide rail pair connected with the base is arranged at the bottom of the movable support; connecting assemblies for fixedly connecting the sliding blocks are arranged on the left side and the right side of the movable support respectively; a driving assembly capable of driving the movable support to move back and forth on the auxiliary guide rail pair is arranged between the movable support and the base, the linear guide rail pair running-in testing machine further comprises a loading assembly capable of applying pressure to the sliding blocks, and the loading assembly is in a jaw shape and enables the two sliding blocks installed on the upper side and the lower side of the guide rail installation plate to abut against the guide rail in a pressing mode. According to the invention, the actual frictional wear condition of the linear guide rail pair under different loads and the service life of the linear guide rail pair under various speed conditions in a speed range of 5m/s can be reliably tested with low cost, and simultaneous running-in of multiple sets of guide rail pairs to be tested can be realized.

The invention discloses an online on-orbit exposure test deformation test probe for a film material and a testing method of the probe. The probe comprises a bracket, wherein at least one test sample is arranged on the bracket; a first cover plate is arranged above one end of the test sample; a second cover plate is arranged above the other end of the test sample; a third cover plate is arranged below the test sample; a light emitting diode is arranged on the second cover plate; a fourth cover plate is arranged on the light emitting diode; a through hole is formed in the third cover plate; a photoelectric sensor is correspondingly arranged below the through hole; the photoelectric sensor is arranged at the end of the bracket; one end of the bracket is connected with the first cover plate, and the other end of the bracket is connected with the second cover plate and the fourth cover plate. The method comprises the following steps: performing calibration and on-line test, wherein the on-line test comprises the following sub-steps: recording the current generated by the photoelectric sensor which corresponds to the test sample, and comparing current data with the data, which is obtained through calibration performed on the ground, of the test sample, thus obtaining the on-orbit linear length change conditions of the test sample along with the temperature. According to the probe, the deformation of a satellite-used polymer film generated along with the temperature change can be tested on line.

The invention relates to a high-temperature burn-in test method, a control end, a tool end and a system for an iMS-CPU board. The test method comprises the steps that a control end sends a first type of data frame to a tool end, the CAN address in the data frame positions that the control end communicates with an iMS-CPU board matched with the CAN address, the control end carries out multiple times of cyclic polling detection, the iMS-CPU board with the corresponding CAN address responds, and a second type of data frame is returned to the control end. Compared with the prior art, the CAN communication state of the iMS-CPU board in the high-temperature environment is monitored in the whole process, the situation that the iMS-CPU board works abnormally in the high-temperature environment and cannot be monitored is avoided, and the test result is more complete and accurate.