Circuit simulation service testing method and system

A technology of business testing and circuit simulation, applied in the field of communication, can solve the problems of manpower and material resources, and achieve the effect of saving test resources
CN102413015AActive Publication Date: 2012-04-11RAISECOM TECH
3 Cites 3 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
RAISECOM TECH
Publication Date
2012-04-11

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention discloses a circuit simulation service testing method. The maximum number N of series-wound paths of an E1 / T1 service port is determined according to a maximum delay in a link and an uplink Ethernet (ETH) bandwidth. The method comprises the following steps that: one-to-one correspondence between each path of E1 / T1 service on an ETH interface on a tested equipment line side and M paths of E1 / T1 services on a tested equipment branch side is established, and a consistent encapsulation format is adopted; the M paths of the E1 / T1 service port on the tested equipment branch side are connected in series to form an M-path series-wound test channel for the E1 / T1 service port, the test channel is connected with an error code tester, and the ETH interface on the tested equipment line side is jointed with an ETH interface of the tested equipment branch side, wherein M is not greater than N, and both M and N are integers; and the error code tester simultaneously tests the M paths of the E1 / T1 service port of the ETH interface of tested equipment through the M-path series-wound test channel for the E1 / T1 service port. The invention also discloses a system based on the same inventive concept. By the method and the system, a multi-path E1 / T1 service port can be tested simultaneously, so test resources are saved.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the field of communication technology, in particular to a circuit simulation service testing method and system. Background technique

[0002] When testing a channelized ETH interface, the bit error performance test of the interface is generally performed by testing one of the E1 / T1 service ports of the N channels of E1 / T1 on the channelized ETH interface. However, due to differences in physical wiring and clock transmission, etc. , each E1 / T1 of the N E1 / T1 service ports of the channelized ETH interface has its own characteristics, and only testing one or a few of them does not represent the bit error of the N E1 / T1M channels of the channelized ETH interface Performance does not mean that the N-channel E1 / T1 service ports and M-channel channels of the channelized ETH interface can send and receive packets normally, so under strict test requirements, all N-channel E1 / T1 service ports of the channelized ETH interface should be te...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More