On-orbit exposure test transmittance change test probe for satellite-used material and using method of probe

Abstract

The invention discloses an on-orbit exposure test transmittance change test probe for a satellite-used material and a using method of the probe. The test probe comprises a bracket, wherein more than two photoelectric sensors are arranged on the bracket, wherein a transparent optical material is correspondingly arranged above each photoelectric sensor; cover plates are arranged on the transparent optical materials; more than two through holes are formed in the cover plates; the transparent optical material is correspondingly arranged below each through hole; the cover plates are fixedly connected with the bracket. The using method comprises the following steps: overlapping the test probe to the exterior of a spacecraft, and measuring the current of each photoelectric sensor during the on-orbit operation period under the same illumination condition; and transmitting the tested current back to the ground, and comparing the current of a test sample with the current of a contrast sample, thus obtaining the comparison current change condition, namely the transmittance change condition of the transparent optical material serving as the test sample in a space environment. The test probe is simple in structure and reliable and can test the optical transmittance change of the satellite-used material during on-orbit exposure on line.

Description

technical field [0001] The invention belongs to the field of testing the space environment effect of spacecraft materials, and in particular relates to a probe for testing the change of transmittance in an on-orbit exposure test of satellite materials and a method for using the same. Background technique [0002] The on-orbit exposure test of satellite materials plays an irreplaceable role in verifying the performance of satellite external materials, verifying ground simulation test data and calibrating ground simulation test methods, and is of great significance to the development of aerospace technology. A large number of material on-orbit exposure tests have been carried out at home and abroad. These tests can be roughly divided into two categories. One is passive exposure tests, that is, material samples are exposed in space, and performance characterization tests are performed on the ground after recovery to obtain material The data of performance change; one is active ...

AI Technical Summary

Problems solved by technology

[0003] During the in-orbit exposure of star materials, the optical transmittance of some materials does not change linearly. In addition, the exposed test samples are easily affected by other factors during the recovery process, resulting in large deviations in the optical transmittance test results. Therefore, it is impossible to Test after recycling

Direct characterization tests on the optical transmittance of materials on the ground generally require the use of special equipment, such as spectrophotometers, which are large in size and weight, high in technical content and precision, and cannot meet the requirements of on-orbit testing

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