Data test method and system, electronic device and computer readable storage medium

A technology for data testing and electronic devices, applied in the computer field, can solve problems such as time-consuming, and achieve the effects of reducing waiting time, shortening testing time, and reducing analysis time

Pending Publication Date: 2019-04-16
PING AN TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem in the prior art that it takes a lot of time to wait for the test results when the data to be tested are separately tested, the present invention provides a data testing method and system

Method used

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  • Data test method and system, electronic device and computer readable storage medium
  • Data test method and system, electronic device and computer readable storage medium
  • Data test method and system, electronic device and computer readable storage medium

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0040] figure 1 It is a schematic flowchart of a data testing method according to an embodiment of the present invention. Such as figure 1 As shown, the data testing method provided in this embodiment includes the following steps:

[0041] first step, such as figure 1 As shown in S1 and S2, the test request is first received, and the corresponding data test mode is entered according to the received test request; then the data to be tested corresponding to the test request is obtained, and the data to be tested is associated with the corresponding test program, Form the test task; the first step is to realize the association between the test program and the test data to form the test task, which is the preparation for the data test.

[0042] The second step, such as figure 1 As shown in S3 in , the synchronous trigger program is started, and the synchronous trigger program is associated with each test task formed in the first step; the second step is used to associate the t...

Embodiment 2

[0056] This embodiment shows the data testing method of the present invention by way of example, in this example, tester A needs to test the data according to three test models of A, B and C, and the three test models of A, B and C can be Test program, three test models A, B and C test the three sets of data of a, b and c respectively.

[0057] Tester A implements the following data testing methods through the server:

[0058] In the first step, tester A turns on the electronic device where the server is located, which can be a computer;

[0059] In the second step, tester A sends a test request, and the test request invokes three test models A, B, and C. In response to the invocation behavior of the test request, the three test models A, B, and C enter the test mode.

[0060] In the third step, tester A grants the three test models A, B and C the authority to call the data in the database; the three test models A, B and C obtain the corresponding data a, b and c to be tested...

Embodiment 3

[0069] Corresponding to the above data testing method, this embodiment provides a data testing system, which is applied to an electronic device, and executes the above data testing method to test each data to be tested, such as figure 2 As shown, the data test system includes a test task establishment unit 101, an association unit 102, a cache unit 103 and a test unit 104. When the data test system works, the test task establishment unit 101, the association unit 102, the cache unit 103 and the test unit 104 transmit sequentially data.

[0070] Wherein, the test task establishment unit 101 is used to receive the test request, enter the corresponding data test mode according to the received test request; then obtain the data to be tested corresponding to the test request, and compare the data to be tested with the corresponding Test procedures are associated to form test tasks. In short, the test task creation unit 101 is used to complete the preparation for data testing.

...

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Abstract

The invention relates to the field of artificial intelligence, and particularly provides a data test method and system, an electronic device and a computer readable storage medium. The test method comprises the following steps: firstly, receiving a test request, and entering a data test mode; then obtaining data needing to be tested, and associating the data with a test program to obtain a test task; starting a synchronous trigger program, and associating the synchronous trigger program with each test task; associating each test task with a synchronous trigger program associated with each testtask, and storing the test task and the synchronous trigger program in a cache region; And when a test triggering instruction is detected, testing work of each test data is carried out at the same time through a synchronous triggering program, and a test result corresponding to the data needing to be tested is obtained. According to the data testing method and system, the electronic device and the computer readable storage medium, all the testing data can be tested at the same time, all the testing processes are carried out at the same time, and compared with one-by-one testing, the testing time is shortened.

Description

technical field [0001] The present invention relates to the field of computer technology, and more specifically, to a data testing method, system, device and readable storage medium. Background technique [0002] In the existing test work, it is often necessary to test multiple and various data. Each test needs to trigger the test application, perform the test, and output the test results. However, in the actual test work, the processor takes a lot of time Analyzing the data requires a lot of testing time for each test; the staff will spend a lot of time waiting for the test results to test the data one by one. [0003] At the same time, triggering test applications and outputting test results are relatively frequent every day, resulting in a large amount of code redundancy, requiring a large amount of storage space, consuming server performance and reducing system efficiency. Contents of the invention [0004] In order to solve the problem in the prior art that it takes ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F9/48
CPCG06F11/3688G06F9/4881
Inventor 秦勇
Owner PING AN TECH (SHENZHEN) CO LTD
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