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Method for determining device damage factor in coexistence of multiple failure mechanisms and application thereof

A failure mechanism and damage factor technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems that have not been considered, and achieve better analysis, better engineering application value, scientific and reasonable analysis

Active Publication Date: 2015-07-01
HEFEI GENERAL MACHINERY RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

But these cases are not considered in API 581

Method used

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  • Method for determining device damage factor in coexistence of multiple failure mechanisms and application thereof
  • Method for determining device damage factor in coexistence of multiple failure mechanisms and application thereof
  • Method for determining device damage factor in coexistence of multiple failure mechanisms and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0068] Determination of damage factors of equipment in environment where naphthenic acid and sulfur coexist

[0069] In the coexistence environment of naphthenic acid and sulfur, there are two dominant mechanisms, namely the dominant mechanism of naphthenic acid corrosion and the dominant mechanism of sulfur corrosion, and the damage factors of the two dominant mechanisms are denoted as F 环烷酸 and F 硫 ; At the same time, there is sulfur's inhibitory effect on naphthenic acid corrosion, which is recorded as the sulfur's inhibitory effect on naphthenic acid corrosion coefficient U 硫-环烷酸 ; Since there is no secondary mechanism, it is denoted as: U k-i = 0, so:

[0070]

[0071]

[0072] Σ i F mi U k - i = 0 ;

[0073] So there are: DF=F 环烷酸 +F 硫 +F 环烷酸 u 硫-环烷酸

[0074] u 硫-环烷酸 Und...

Embodiment 2

[0092] Determination of damage factors of austenitic stainless steel equipment in the environment of chloride ion and alkali coexistence:

[0093] In the coexistence environment of chloride ions and alkali, there are two mechanisms of chloride ion stress corrosion cracking ClSCC and alkali stress corrosion cracking ASCC;

[0094] When the temperature is less than 150°C, CLSCC is the dominant mechanism, denoted as F 氯离子 , with ASCC as the secondary mechanism, and the promotion effect of alkali on chloride ion stress corrosion cracking at the same time, which is denoted as the promotion effect coefficient of alkali on chloride ion stress corrosion cracking U 碱-氯离子 ,therefore:

[0095]

[0096] Σ i F mi U i ′ - i = 0 ;

[0097]

[0098] From this we get...

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Abstract

The invention discloses a method for determining device damage factors in coexistence of multiple failure mechanisms, which is characterized in that the device damage factor DF(t) in the coexistence of multiple failure mechanisms is disclosed in the specification, wherein Fmi is the sum of independent damage factors of i dominant mechanisms; FmiUi'-i is the sum of interactional damage factors of the dominant mechanisms; and FmiUk-i is the sum of effect damage factors of various secondary mechanisms on the dominant mechanisms. The method considers the interactions of the dominant mechanisms, the effects of the secondary mechanisms on the dominant mechanisms and other factors while determining the damage factor, and improves the relevant method in API581, so that the device failure probability analysis in risk assessment is more scientific, reasonable and practical.

Description

technical field [0001] The invention relates to a method for determining equipment damage factors in an environment with failure mechanisms, more specifically, a method for determining equipment damage factors in an environment where multiple failure mechanisms coexist. Background technique [0002] The determination of the corrosion rate of steel in the medium environment is crucial to the determination of material selection and structural size in the design stage, and in the use stage, the determination of the possibility of equipment failure is even more important for the estimation of the inspection period and remaining life of the equipment. [0003] In the 2008 edition of API 581 (Risk-Based Inspection Technique), the failure probability of equipment is calculated according to the following formula: [0004] P f (t)=G ff ×DF(t)×F MS (1) [0005] In the formula: P f (t) is the probability of equipment failure; [0006] G ff is the average failure prob...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 陈学东艾志斌胡久韶杨铁成关卫和梁春雷高俊峰
Owner HEFEI GENERAL MACHINERY RES INST
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