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IC pin open short circuit test method

A technology of open-short-circuit testing and pins, which is applied in the field of IC pin open-short-circuit testing, can solve problems such as delaying test procedures, effective communication and feedback, and imperfect test systems, so as to save test maintenance costs, improve test efficiency, low cost effect

Inactive Publication Date: 2012-10-03
SUZHOU HUAXIN MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the fact that there are so many OEM manufacturers engaged in product circuit testing in the market, the test system developers of OEMs and product designers of chip design companies often cannot communicate and give feedback in a timely and effective manner, resulting in delays in testing. Problems related to program development or development and testing systems are not perfect, which makes it impossible to test the chip in a timely and effective manner

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Embodiment Construction

[0024] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings and a preferred embodiment.

[0025] Suppose there is an unknown IC chip (such as figure 2 ), when you don’t know its pin distribution, you can accurately find out the VDD pin and VSS pin through the following methods, and test the open and short circuit characteristics of the remaining chip pins:

[0026] Step 1, provide a constant current source:

[0027] Use TL431 and some related devices to form a constant current source circuit (structure such as figure 1 Shown include: two 1K resistors R2, a 0.1uF capacitor C1, two triode models are 9013 and 9015, a switching diode 1N4148, a three-terminal parallel voltage regulator UA431, a load RX and adjust the current size Resistor R1), and use it to provide a constant current of 100uA to 500uA (the value of the constant current can be adjusted according to actual needs, generally speaking, the curr...

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Abstract

The invention relates to an IC (Integrated Circuit) pin open short circuit test method. The method comprises the following steps of: selecting any pin of an IC chip to be tested and supposing that the pin is a pin VDD, and selecting any more than two pins from the other pins as the comparison pins; grounding the supposed pin VDD or connecting the supposed pin VDD with 0V voltage, and respectivelyproviding a constant current to the comparison pins; detecting the voltage of each comparison pin, determining that the supposed pin VDD is a real pin VDD if the voltage value of one comparison pin is 0.3-1.3V, but not vice versa; and repeating the steps till all the real pins VDD are detected if the supposed pin VDD is not a real pin VDD. The detection method of a pin VSS is similar to the test method of the invention. After all the pins VDD and all the pins VSS are detected, an open short circuit characteristic test is performed to the other pins on the IC chip to be tested. The invention is simple and easy to operate, accurate and effective, low in cost, and widely suitable for complex integrated circuits.

Description

technical field [0001] The invention relates to an IC pin open-short test method applied in the fields of IC package detection, IC die binding detection and the like. Background technique [0002] Open short test (open_short_test, also known as continuity test or contact test) is a very fast way to find out whether the connection of each pin of the chip is normal and whether there are missing bond wires (binding failure) when the chip is packaged. It can also find the test Whether the contact is good, whether there is a problem with the probe card or the test socket. [0003] The test principle of open short circuit test is relatively simple, divided into open_short_to_VDD test and open_short_to_VSS test. Generally speaking, each pin of the chip has a discharge or protection circuit, which is equivalent to two diodes connected end to end, with one end connected to VDD and the other end connected to VSS, and the signal comes in from the junction of the two diodes. [0004] ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/02G01R31/28
Inventor 马春龙贾力曹明润
Owner SUZHOU HUAXIN MICROELECTRONICS