Measurement-based modeling method by prediction on electromagnetic emission broadband behavioral level of electronic component

A technology of electronic components and modeling methods, which is applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve problems such as difficulty in finding IBIS models, unrealistic modeling users, and insufficient research on electromagnetic compatibility issues, etc.

Active Publication Date: 2012-10-17
BEIHANG UNIV
View PDF3 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In electronic components, since the general working mechanism of active devices is relatively complex, it is the main source of electromagnetic interference. Previously, the modeling of electromagnetic emission of devices was mainly done by the designers of electronic components to simplify the circuit when they knew the internal circuit of the device. Then it is applied to PCB simulation, but this kind of modeling is unrealistic for users. The real method of establishing a device model based on measurement is the IBIS (Input / Output Buffer Information Specification) proposed in the 1990s. Model reference [Hobbs W; MuranyiA; Rosenbaum R IBIS: I / O buffer information specification, overview 1994], however, the IBIS model is only for input and output signals, and cannot meet the simulation requirements of electromagnetic compatibility
And for most users who care about the electromagnetic compatibility of electronic components, it is difficult to find the IBIS model of the electronic components used in most cases. Even if the IBIS model is obtained, it is often not enough for the study of electromagnetic compatibility

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measurement-based modeling method by prediction on electromagnetic emission broadband behavioral level of electronic component
  • Measurement-based modeling method by prediction on electromagnetic emission broadband behavioral level of electronic component
  • Measurement-based modeling method by prediction on electromagnetic emission broadband behavioral level of electronic component

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0097] A band-pass surface acoustic wave filter B3732 mounted on a PCB has a center frequency of 433.92MHz and a passband of 0.72MHz. In order to evaluate the influence on the performance of the filter during actual installation and to design the front-end and back-end matching circuits well, the S-parameters after installation are measured using Yanetics.

[0098] The measurement results in the 380MHz-485MHz frequency band are shown in Figure 5, the S21 curve in the figure is relatively rough, and there are a large number of extreme points. Therefore, the scattering parameter of the B3732 filter is relatively complex, and it needs to be approximated by a 175-order high-order pole residue model, and the result is as follows Figure 6A , Figure 6B , Figure 6C shown Figure 6A and Figure 6B are the amplitude and phase approximation results of the Y parameters of the B3732 port of the SAW filter, respectively. Since the B3732 filter has reciprocity and structural symmetry,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a measurement-based modeling method by prediction on an electromagnetic emission broadband behavioral level of an electronic component. The method comprises the following steps of: firstly carrying out active and passive judgments on a measured object, thus acquiring a port scattering parameter of the measured object; then performing vector fitting algorithm on the mapped port scattering parameter to acquire a state space model; and then converting the state space model into an SPICE (Simulation Program with Integrated Circuit Emphasis) circuit to be finally applied to circuit simulation. According to the invention, the modeling method by the prediction on the behavioral level can accurately establish an equivalent broadband model of the complicated electronic component by measuring data within a certain bandwidth or under fewer sampling points without relying on a simulation model provided by an electronic component manufacturer, and can achieve electromagnetic emission simulation on the circuit.

Description

technical field [0001] The invention relates to a predictive modeling method in the electromagnetic field, more particularly, to a measurement-based broadband behavior-level predictive modeling method for electromagnetic emission of electronic components. Background technique [0002] In recent years, people have paid more and more attention to electromagnetic compatibility. From the previous focus on the external launch of the system to the current focus on the underlying electromagnetic launch. However, in the past few years, the focus was often only on the wiring on the PCB (printed circuit board), the interconnection of the crystal oscillator, etc. In recent years, researchers have found that the electronic components on the circuit board will also generate electromagnetic interference. Improper control can also cause serious electromagnetic compatibility (EMC) problems. In electronic components, since the general working mechanism of active devices is relatively comple...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G01R31/00
Inventor 谢树果陈曦孙宏涛赵明敏马超张宇刘亚奇高娜
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products