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Integrated circuit

A technology of integrated circuits and driver circuits, which is applied in the direction of electronic circuit testing, marginal circuit testing, and electrical measurement, and can solve problems such as slow processes

Active Publication Date: 2013-03-06
NXP BV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The process of reducing the external resistance by subsequent closing of the relay is relatively slow and has limited resolution

Method used

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Embodiment Construction

[0031] in figure 2 In, the PMOS power transistor 11 and the NMOS power transistor 12 are coupled in series at the positive (V SUP ) Power rail and negative (-V SUP ) Between power rails. The PMOS power transistor 11 and the NMOS power transistor 12 form part of the output stage of the class D amplifier and are on an integrated circuit. The integrated circuit can be switched between operation mode and test mode. In the operation mode, the PMOS power transistor 11 and the NMOS power transistor 12 are driven by a driver circuit (not shown) to generate an output signal that is an amplified version of the input signal.

[0032] In the test mode, the PMOS power transistor 11 is biased by the voltage source 13 also on the integrated circuit to act as a current source for use in the on-resistance measurement of the NMOS power transistor 12. The path of the current is figure 2 Is shown by the arrow, and it flows from the CVI 14 to the source of the PMOS power transistor 11, through t...

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PUM

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Abstract

An integrated circuit comprising a first pair (11, 12) of switching devices arranged in series between positive and negative supply terminals is disclosed. The integrated circuit is switchable between an operational mode, in which the first pair (11, 12) of switching devices are driven to couple either the positive or negative supply terminal to an output terminal, and a test mode, in which a current source on the integrated circuit is driven to cause a desired current to flow in a first one (12) of the first pair (11, 12) of switching devices.

Description

Technical field [0001] The present invention relates to an integrated circuit comprising a first pair of switching devices arranged in series between a positive power supply terminal and a negative power supply terminal and a method of testing such an integrated circuit. Background technique [0002] Class D amplifiers are often used as speaker drivers in consumer, automotive and mobile applications. The key part of the Class D amplifier is the output stage. figure 1 A typical example of the output stage is shown in. It consists of alternately outputting node V out Connect to negative (-V SUP ) Or positive (V SUP ) The power rail consists of two large power transistors 1 and 2. [0003] The gate of the low-side power transistor 2 is controlled by the gate driver 3, which charges the gate to the maximum voltage V GLon To turn it on or short the gate to the source to turn it off. The gate driver 4 of the high-side power transistor 1 is complementary. The gate driver is control...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/275G01R31/3004G01R31/28H03F3/2173
Inventor M·贝尔库特
Owner NXP BV