Detection method of integrated machine performance suitable for atomic clock
A detection method, atomic clock technology, applied in the field of detection, can solve the problems of long-term stable operation and accuracy of atomic clocks, etc., and achieve the effect of accurate performance of the whole machine
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] In order to further explain the technical means and effects that the present invention takes to achieve the intended purpose of the invention, below in conjunction with the accompanying drawings and preferred embodiments, the specific implementation and work of the detection method applicable to the performance of the whole machine proposed by the present invention The principle is explained in detail.
[0035] Depend on figure 1 It can be seen that the detection method applicable to the overall performance of the atomic clock provided by the present invention includes:
[0036] First, the original signal output by the signal source is fed back through the signal generated by microwave processing and the output signal of the physical system of the atomic clock; at the same time, the voltage-controlled oscillator is used as the external time base reference source of the signal source; among them, the voltage-controlled oscillator The oscillation frequency is f=10MHz. Si...
PUM

Abstract
Description
Claims
Application Information

- R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com