Method for quantitative calculation of thickness of thin reservoir layer
A quantitative calculation, thin reservoir technology, applied in the field of thin reservoir exploration, can solve the problem of strict requirements and limitations in the acquisition and processing of seismic data depending on drilling and absolute magnitude of reflection coefficient, and achieve the effect of high calculation accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Example Embodiment
[0027] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0028] figure 1 It is a flowchart of a method for quantitatively calculating the thickness of a thin reservoir by using the relative spectral peak frequency increment attribute according to an embodiment of the present invention. Such as figure 1 As shown, the method includes the following steps:
[0029] S101. Acquire multiple coverage high-resolution 3D seismic surveys on the surface to obtain 3D seismic data. Specifically, in step S101...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap