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High-performance bending accelerometer

An accelerometer and elastic technology, applied in the field of high-performance bending accelerometers, which can solve the problems of large property changes, limited use, poor component uniformity, etc.

Inactive Publication Date: 2014-01-01
MICROFINE MATERIALS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Piezoelectric single crystals are highly anisotropic, and currently available PZN-PT and PMN-PT single crystals have the disadvantages of high production costs, poor compositional uniformity, and large property variations
These deficiencies may lead to their current limited use

Method used

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Embodiment Construction

[0058] Referring now to Figures 1 to 1 of the accompanying drawings Figure 11 Preferred embodiments of the present invention are described. The same elements in different figures are denoted by the same reference numerals.

[0059] Figures 1(a) and 1(b) show an elastic substrate beam in four-point bending according to the prior art; that is, the elastic substrate beam is fixed or simply supported at both ends, Or intermediate conditions with two point loads or line loads equidistant from the center line. In Fig. 1(a), the two ends (4) of the elastic beam substrate (2) are shown fixed to the fixed support (6), while in Fig. 1(b), the elastic substrate is shown The two ends (10) of (8) are simply supported by supports (12). In each case, the force or pressure (P) is applied at a point remote from the centerline (14).

[0060] An end-fixed four-point bending accelerometer can be realized by fixing the elastic beam substrate at its two ends and attaching the two inertial mass...

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PUM

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Abstract

An accelerometer comprises an elastic substrate beam having a first end and a second end and having upper and lower surfaces; supports to support the first and second ends of the substrate beam; sensing elements comprising piezoelectric material bonded onto the upper, lower or both the upper and lower surfaces of the substrate beam; and force applying elements for applying forces at two locations between the first and second ends. The substrate beam and the piezoelectric materials operate in a four-point bending configuration. Optionally the first and second ends of the substrate beam are formed by bending the substrate beam to reduce the physical dimensions of the device.

Description

technical field [0001] The invention herein relates to high performance bending accelerometers, and more particularly, the invention relates to accelerometers operating in a four-point bending configuration and including piezoelectric materials as sensing elements. Background technique [0002] Accelerometers using piezoelectric materials as sensing elements have been widely used. In bending-type accelerometers, piezoelectric sheets or layers are bonded to elastic beams or planar substrates that deform in bending, thus producing an electrical output. [0003] To achieve high sensitivity in accelerometers, cantilever beams are widely used as substrates due to the large strains available over a small span near the fixed end. However, the use of larger piezoelectric elements does not provide much advantage in this design due to the large strain gradient. In addition, large, concentrated strains near the fixed end may lead to fracture of the bonded brittle piezoelectric active...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01P15/09G01P13/00
CPCG01P15/0922
Inventor 金兢张伟文夏跃学
Owner MICROFINE MATERIALS TECH